Hostname: page-component-cd9895bd7-lnqnp Total loading time: 0 Render date: 2024-12-27T07:54:49.764Z Has data issue: false hasContentIssue false
  • English
  • Français

The Influence of TEM Education on TEM Development

Published online by Cambridge University Press:  14 March 2018

D. B. Williams
D. B. Williams*
Affiliation:
Lehigh University

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Learning how to operate the microscope has dominated the TEMteaching process in a way that is perhaps unparalleled by any other common scientific instrument. The TEM column is so complex that the arcane aspects of its manual manipulation become the main points to be learned by the student, rather than the use of the instrument to solve materials problems. In other words, command of the instrument often becomes an end in itself. Such an approach would preach that it is better to be able to produce a striking CDF image that is well aligned and focused than it is to be able to interpret that image in terms of the materials processing responsible for the microstructure!

Type
Research Article
Information
Microscopy Today , Volume 7 , Issue 2 , March 1999 , pp. 28 - 29
Copyright
Copyright © Microscopy Society of America 1999

References

Hirsch, P.B, Howie, A., Nicholson, R.B, Pashley, D. W and Whelan, M.J., (1963) Electron Microscopy of Thin Crystals, Butterworths, London; (second edition, 1977), Krieger. NY.Google Scholar
Reiner, L. (1984) Transmission Electron Microscopy, (1st edition) Springer Verlag. NY Google Scholar
Edington, J, W. (1976) Practical Electron Microscopy in Materials Science, Van Nostrand Reinhold, NYGoogle Scholar
Thomas, G. (1962) Transmission Electron Microscopy, John Wiley & Sons, NY This article is based on a talk given at a symposium on "The Future of Remote Microscopy in Materials Education" at Carnegie-Mellon University, October 25, 1998.Google Scholar