Agilent Technologies
Tel: 480-756-5900
Email: afm-info@agilent.com
Agilent AFM & FE-SEM
APPLICATIONS: • Atomic Force Microscopes • Scanning Electron Microscopes • Scanning Probe Microscopes • Scanning Tunneling Microscopes
FEATURES: Nanotechnology instrumentation including atomic force microscopes (AFM) & field emission scanning electron microscopes (FE-SEM) for materials and life sciences characterization at the nanoscale.
Bruker Optics
Tel: 978-439-9899 x5216
Email: nancy.wright-ross@brukeroptics.com
Hyperion Series – Infrared Microspectroscopy
APPLICATIONS: • FT-IR Microscopy • Infra-Red Microscopes
FEATURES: The Hyperion Series features full automation, infrared chemical imaging, crystal-clear sample viewing, and a wide variety of IR and visible objectives. The Hyperion Series provides everything needed to conduct the most demanding, micro-analysis easily and effectively. It can be coupled to TENSOR and VERTEX series FT-IR Spectrometers. The Hyperion incorporates state-of-the-art Focal Plan Array detectors for the most demanding infrared imaging applications. High Resolution chemical images can be collected in a matter of seconds. Its field of use is extremely broad and includes materials research, polymers, chemicals, forensics, art conservation, and life sciences
LUMOS – Stand-alone FT-IR Microscope with Full Automation
APPLICATIONS: • FT-IR Microscopy • Automated • Infra-Red Microscopes • Raman Spectroscopy/Microscopy • Forensic
FEATURES: Lumos is a stand-alone FT-IR microscope with full automation. It is designed to combine best performance for visible inspection and infrared spectral analysis with the highest ease of use. Due to the motorization and networking of all moveable components inside the Lumos, the system provides a high degree of automation. The intuitive software of the Lumos guides the operator step by step through the process of data acquisition. 10 year warranty on laser & interferometer, 5 year warranty on IR source. Comprehensive validation with 21 CFR part 11.
http://www.bruker.com/products/molecular-vibrational-spectroscopy/ft-ir/lumos/overview.html
CoolLED USA
Tel: 1.800.877.0128
Email: dave.denu@coolled.com
CoolLED pE-Series LED Illumination Units
APPLICATIONS: • Fluorescence Microscopy • Illuminators (LOM) • Lamps and Light Sources • LED Illumination (LOM) • Fiber Optic Illuminators
FEATURES: Contact CoolLED's new U.S. office to learn more about our wide range of LED illumination products for fluorescence and optogenetics.
Diatome U.S.
Tel: 215-412-8390
Fax: 215-412-8450
Email: sgkcck@aol.com
Cryo Immuno
The first cryo knife with a diamond platform and 35° cutting angle that leads to a considerable reduction in mechanical stresses and therefore to improved structure preservation in sucrose-protected samples.
EDAX Inc.
Tel: 201-529-4880
Email: sue.arnell@ametek.com
TEAM™ Pegasus Analysis System
APPLICATIONS: • Materials Characterization • EDS • EBSD • Fully integrated EDS-EBSD • OIM™ Analysis
FEATURES: Easy to use TEAM™ user interface. Dynamic EDS and EBSD mapping for real time data analysis. Three clicks from start to final report.
http://edax.com/Products/Integrated/TEAM-Pegasus-Integrated-EDS-and-EBSD-Analysis-System.aspx
Hikari XP EBSD Camera
APPLICATIONS: • High speed EBSD data collection • Detailed microstructural characterization • Orientation precision • High indexing rates
FEATURES: Results without compromise. Highest orientation precision. Industry best sensitivity for operation at beam currents as low as 100 pA with >99% indexing success rates.
http://www.edax.com/Products/EBSD/Hikari-XP-EBSD-Camera.aspx
Octane Silicon Drift Detector Series
APPLICATIONS: • High Quality EDS Data Acquisition • SEM Microanalysis • TEAM™ EDS Software Suite
FEATURES: High speed, high quality data collection. Four models for key microanalysis applications. Smart features guarantee optimized acquisition setup and quality data.
http://www.edax.com/Products/EDS/Detectors/Octane-Silicon-Drift-Detector-Series.aspx
Electron Microscopy Sciences
Tel: 215-412-8400
E-mail: stacie@ems-secure.com
EMS-002 Cryo Workstation
The EMS-002 Cryo Workstation is a complete ultra rapid freezing system that captures rapid events and labile structures that are not seen in chemically fixed materials.
Evans Analytical Group
Tel: +1-408-530-3500
Email: info@eaglabs.com
Material Characterization
APPLICATIONS: • Microscopy Services • Surface Analysis • Service Laboratories • Microanalysis Services • Failure Analysis
FEATURES: Providing high quality microscopy services including: SEM, S/TEM, EDS, EELS, EBIC, CL, EBSD, FIB. Coming soon in early 2013: Hitachi HD-2700 Aberration Corrected STEM services.
Hamamatsu Corporation
Tel: 908-231-0960
Email: aperrine@hamamatsu.com
ORCA-Flash4.0 Camera
APPLICATIONS: • CMOS cameras • Camera/Digital camera systems • Fluorescence microscopy • Spinning disk confocal microscopy
FEATURES: Superresolution microscopy • TIRF, confocal microscopy • FRET • Live-cell imaging • 4 megapixels • 30 fps or 100 fps • High sensitivity • Low noise
Hitachi High Technologies America, Inc.
Tel: 800-548-9001
Fax: 972-615-9322
Email: emdwebsite@hitachi-hta.com
Hitachi Electron Microscopes and Focused Ion Beam Systems
APPLICATIONS: Focused Ion Beam Systems • Scanning Transmission Electron Microscopes (STEMs) • Scanning Electron Microscopes (SEMs) • Transmission Electron Microscopes (TEMs) • Variable Pressure Scanning Electron Microscopes
FEATURES: Reliability-proven scanning electron microscopy (SEM), analytical and biological transmission electron microscopy (TEM), dedicated STEM, focused ion beam (FIB), tabletop microscopes, and microanalysis sample preparation systems
http://www.hitachi-hta.com/products/electron-microscopes-and-focused-ion-beam
ibss Group, Inc.
Tel: 415-566-5774
Email: admin@ibssgroup.com
GV10x DS Asher
APPLICATIONS: Anti-contamination Systems • SEM • Dual Beam FIB/SEM • Helium Microscope • TEM
FEATURES: A unique plasma source is the GV10x Asher engine that produces both high power and low pressure plasma operation to clean chambers and specimens in-situ.
IXRF Systems, Inc.
Tel: 512-386-6100
Email: Info@ixrfsystems.com
Iridium Ultra Microanalysis Systems
APPLICATIONS: • Detectors • Energy Dispersive X-ray Spectrometry (EDS) • Software for Microscopy • Software for Microanalysis • Scanning Electron Microscopes (SEMs)
FEATURES: Simple to advanced EDS analysis. Digital imaging features analysis and measurement software suite included. High throughput for high speed, superior, X-ray mapping.
EDS Detectors
APPLICATIONS: • Detectors • EDS Detector Repairs/ Upgrades • Energy Dispersive X-ray Spectroscopy (EDS) • Scanning Electron Microscopes (SEMs)
FEATURES: Premium resolution Silicon Drift (SDD) and SiLi detectors. Variety of sizes from 10–60 mm. Very best low energy peak performance. Micro-XRF in the SEM.
Micro-XRF in the SEM
APPLICATIONS: • X-ray Analysis • XRF for the SEM • Scanning Electron Microscopes (SEMs)
FEATURES: Micro-XRF systems inside the SEM- Quantitative XRF analysis. PPM trace elements in standard SEM samples.
L.A. Giannuzzi & Associates LLC
Tel: +1-321-663-3806
Email: info@LAGiannuzzi.com
EXpressLO™ Lift-Out System and Grids
APPLICATIONS: • FIB accessories • FIB lift-out • TEM grids • TEM specimen preparation • ATP specimen preparation
FEATURES: EXpressLO™ allows fast and easy ex-situ lift-out – no carbon support film needed. No expensive FIB time required. Simple manipulation for routine backside milling reduces curtaining.
Leica Microsystems
Tel: 800-248-0123
Fax: 846-405-0164
Email: yourimage@leica-microsystems
Leica EM CPD Critical Point Dryer
APPLICATIONS: • Life Sciences • Materials Science • Critical Point Drying • SEM Sample Preparation • High-quality Samples
FEATURES: Dries delicate biological or industrial samples in a fully automated, controlled process to preserve surface structure for subsequent treatment and analysis.
Leica EM VCT100 Vacuum Cryo Transfer System
APPLICATIONS: • Life Sciences • Mounts to Any Vacuum-operated SEM, FIB, SIMS, AFM, or XPS Chamber • Contamination-free Cryo Transfer
FEATURES: Samples are transferred in a well-defined environment, e.g., protective gas or high vacuum from a preparation instrument to analysis unit: can be kept at low-temperature for cryo techniques.
Leica EM TIC 3X Ion Beam Slope Cutter
APPLICATIONS: • Materials Science • Triple Ion Beam Cutter • Cross-sections for SEM, Microstructure Analysis, and AFM • Sample Preparation • Milling at High Rates
FEATURES: For high-quality cross sections of materials, this instrument features three individually controlled ion beams that can cut up to three deep, broad samples in one process.
Leica EM ACE Series of Coaters
APPLICATIONS: • High vacuum coating for FE-SEM and TEM • Low vacuum coating – Sputter Coating and Carbon Thread • Sample Preparation
FEATURES: The latest advance in automated low vacuum and high vacuum coating systems – one touch coating with a small footprint.
Leica EM UC7 Ultramicrotome
APPLICATIONS: • Life Sciences • Sample Preparation for TEM, SEM, AFM, and LM • Room Temperature and Cryo Sectioning • Materials Science • Semi- and Ultra-thin Sections
FEATURES: Provides easy preparation of semi- and ultra-thin sections as well as perfect, smooth surfaces of biological and industrial samples for TEM, SEM, AFM, and LM examination.
Lumen Dynamics
Tel: 905-821-2600 or 1-800-668-8752 (for USA and Canada)
Email: X-Cite@ldgi.com
X-Cite® Light Sources
APPLICATIONS: • Fluorescence excitation light source • Fluorescence microscopy illumination • Fluorescence excitation • Excitation light source • Fluorescence microscopy
FEATURES: X-Cite® excitation light sources for fluorescence microscopy offer a wide range of feature sets and accessories to optimize illumination performance, maximize convenience, and simplify maintenance.
McCrone Microscopes & Accessories
Tel: 630-887-7100
Email: lbolin@mccrone.com
NeoScope II Benchtop SEM
APPLICATIONS: • Benchtop Electron Microscopes • Camera/Digital Camera Systems • Digital Microscope • Freeze Drying Equipment • Heating Stages
FEATURES: Widest magnification range 10×–60,000× • No special sample prep • EDS for elemental analysis • Images in under 3 minutes • Intuitive touchscreen Interface
Media Cybernetics
Tel: 301-495-3305
Email: dfbaum@mediacy.com
Image-Pro Premier Software
APPLICATIONS: Cell Biology • Pathology & Histology • Neuroscience • Industrial Inspection • Forensics Inspection
FEATURES: 64-bit support, User-friendly interface, Intuitive macros and app building tools, New and improved ways to automatically segment, classify and measure objects, Tools for customizing workflow
AutoQuant X3 Software
APPLICATIONS: Fluorescence microscopy • Confocal microscopy • FRET • DIC • Life science and industrial imaging
FEATURES: 2D and 3D blind deconvolution, 3D visualization, Faster multi-core processor distributing, New file format support, New 3D blind confocal algorithm
Olympus Soft Imaging Solutions GmbH
Tel: 0049 251 798 000
Email: Manfred.Kaessens@olympus-sis.com
Quemesa — Fast High-Resolution Bottom-Mounted 11 Megapixel TEM Camera
APPLICATIONS: Materials Sciences, Diffraction, HR-TEM, Life Sciences, Electron Tomography
FEATURES: • Up to 4008 × 2672 pixels • More than 12 fps @ binning 4 • Fibre optically coupled (2:1 Taper) • Dedicated water cooling system • 14-bit
Veleta — 2k x 2k Side-Mounted TEM Camera
APPLICATIONS: Materials Sciences, Diffraction, Life Sciences, Electron Tomography, Pathology
FEATURES: • Up to 2048 × 2048 Pixel • More than 19 fps @ binning 4 • Peltier-cooling • 14-bit • Lens coupled
Oregon Physics
Tel: 503-601-0041
Email: info@oregon-physics.com
Hyperion Ion Source
The Hyperion Ion Source is a high brightness plasma ion source for high current and high resolution applications.
APPLICATIONS: Focused Ion Beam Systems, Dual Beam FIB/SEM, Mass Spectrometry, Ion Guns
FEATURES: High brightness ion source • Xenon, oxygen, and hydrogen beams • Positive and negative ions • High current FIB milling • High resolution primary beams for mass spectrometry
FIB Aperture Strips
Oregon Physics manufactures high quality aperture strips for focused ion beam systems that cost 40% less than OEM aperture strips.
APPLICATIONS: Focused Ion Beam Systems • Dual Beam FIB/SEM
FEATURES: High quality FIB aperture strips • Ten, twelve, and fifteen hole aperture strips available • Customer specified custom configurations • Three day delivery on most custom aperture strips
http://www.oregon-physics.com/products/fib_aperture-strips.html
Analytical Services
Oregon Physics utilizes its unique xenon plasma fib systems to provide micromachining and analytical services.
APPLICATIONS: Semiconductors • Material Science
FEATURES: Large area cross-sectioning with plasma FIB • 3D Tomography • Through-silicon-via quality control • Failure analysis • Sample preparation
http://www.oregon-physics.com/lab_services/fib_micromachining.html
Electron Guns
APPLICATIONS: SEM • Electron Lithography
FEATURES: Custom electron optics design and modeling • Specialty emitters • Compact gun designs • Imaging and E-beam lithography applications
PI (Physik Instrumente) L.P. Piezo & Nanopositioning
Tel: 508-832-0506
Email: info@pi-usa.us
Piezo Nanopositioners for SR Microscopy/Nanofocus Stages
APPLICATIONS: • Microscope Stages • Nanopositioners/Piezo • Fast Piezo Autofocus • Lens Positioners • Stage Automation
FEATURES: Piezo scanning stages • Fast lens nanofocus nanopositioners • Long-travel high stability ultrasonic XY stages • Steering mirrors • For SR microscopy and two-photon microscopy
SPI Supplies/Structure Probe, Inc.
Tel: 610-436-5400
Email: sales@2spi.com
Vacu Prep II
APPLICATIONS: Materials Science • Life Science • Semiconductor • TEM
FEATURES: Turbo molecular pump for fast and clean pump down times; simple automated operation for evaporation or sputtering, 60 liter/minute turbo molecular pump; interactive touch screen control pad, rotation assembly, LN2 trap and funnel.
Plasma Prep III
APPLICATIONS: Materials Science • Life Science • Semiconductor • Asbestos
FEATURES: Solid state RF generator capable of 1 to 100W operations; Low temperature asher/etcher; small footprint; 4″ diameter x 6″ depth Pyrex or Quartz Chamber; Optional Process Controller; Optional system for cleaning TEM Specimen Holders.
Osmium Plasma Coaters
APPLICATIONS: Materials Science • Semiconductor • Life Science • High Resolution SEM
FEATURES: Thin (1 nm) osmium metal coatings with no grain structure; Excellent for High Resolution FE-SEMs; Ideal for heat sensitive samples; No oxidation of coating.
SputterEtch Tech, Inc. Dba: Anatech USA
Tel: 510-401-5990
Email: tawatts@anatechusa.com
Hummer Sputter Systems
APPLICATIONS: • SEM/TEM Digital Imaging Systems • X-Ray Analysis • R&D Sputter Systems • R&D, Pilot Production Systems • Evaporation Systems
FEATURES: Anatech USA sputtering systems are manufactured to meet your specific requirements. Our process, control, and system engineers use standard system platforms, add standard or custom modules, depending on your application, your process, and your throughput requirements. Anatech USA builds the right tool for your particular job.
Sutter Instrument
Tel: 415-883-0128
Email: info@sutter.com
SmartShutter™
APPLICATIONS: Shuttering, Fluorescence Microscopy, Life Sciences, Imaging Hardware
FEATURES: • Life tested to 100 million cycles • Complete opening time 8 msec from trigger • Select partial opening function for neutral density capability • “Soft” mode provides minimum vibration • Stand alone, or use with Sutter filter wheel
Lambda LS
APPLICATIONS: Microscope Illumination, Fluorescence Microscopy, Life Sciences, Imaging Hardware, OEM Illumination
FEATURES: • Pre-aligned bulb eliminates common focusing problems • Equipped with cold mirror to protect down stream optical components • Easily coupled to most microscopes • Modular construction allows use of optional liquid light guide • Accommodates Sutter filter wheels or SmartShutter™ within cabinet
Lambda XL
APPLICATIONS: Microscope Illumination, Fluorescence Microscopy, Life Sciences, Imaging Hardware, OEM Illumination
FEATURES: • 10,000 hour expected lifetime for bulb • No high-voltage pulse • Highly stable output (less than ±1% fluctuations) • Built-in driver for Sutter filterwheel and SmartShutter • Low light loss through bulb life
Lambda DG-4 / DG-5 PLUS
APPLICATIONS: Fluorescence Microscopy, Ratio-metric Imaging, Wavelength Switching, Imaging Hardware, Life Sciences
FEATURES: • 0.5 msec switching between filters • Integrated light source and wavelength switching excitation system • Holds four or five interference filters and one neutral density filter • Light guide output provides uniform illumination • Direct computer control via parallel or serial interface
Lambda 10-3
APPLICATIONS: Fluorescence Microscopy, Ratio-metric Imaging, Wavelength Switching, Imaging Hardware, Life Sciences
FEATURES: • As fast as 40 msec between adjacent filters (10 position wheel) • As fast as 31 msec between adjacent filters (4 position wheel) • Can control up to 3 wheels and 2 shutters, or 2 wheels and 3 shutters • Compatible with SmartShutter™ stepper-motor controlled shutter • Controls a variety of 12, 25, 32, and 50 mm filterwheels
MPC-385 / MPC-325
APPLICATIONS: Life Sciences, Micromanipulation, Electrophysiology
FEATURES: • Single controller and ROE will run 2 stepper motor drive manipulators • User-friendly interface: single button access to all major functions • Accelerated mode for fast, manual manipulator movement • Definable 4th axis for coaxial pipette movement • Ultra-low drift, ultra-smooth movement.
Ted Pella, Inc.
Tel: 800-237-3526
Email: sales@tedpella.com
High Resolution FE-SEM Sputter Coaters
APPLICATIONS: Life Sciences, Materials Science, Semiconductors, SEM
FEATURES: • Grain-free, ultra-thin uniform and conform coating • Wide choice of operating parameters to accommodate all sample types • Purpose designed with optimized vacuum pumping system • Includes Rotary-Planetary-Tilting stage and high resolution thickness controller • Easy to operate with fast cycle times
The PELCO BioWave® Pro Microwave Tissue Processor
APPLICATIONS: Life Sciences, Flourescence Microscopy, TEM, Image Analysis
FEATURES: • Superior Microwave Processing Control • Precision Sample Temperature Control • Unrivaled Application Flexibility • Consistent Quality Results • True ease of operation
PELCO easiGlow™
APPLICATIONS: Life Sciences, Materials Science, TEM, Tomography
FEATURES: • Precise and easy vacuum settings • Short cycle times • Consistent results • Intuitive touch screen for control and display • Supports hydrophilic/hydrophobic and negative/positive modes
PELCO® Silicon Nitride Support Films
APPLICATIONS: TEM, STEM, Thin Film Research, Life Sciences, Material Sciences
FEATURES: • Debris free and resilient films • Available membrane thickness of 8, 15, 50, and 200 nm • 3 mm diameter frame fits perfect in TEM holders • EasyGrip™ edges for improved handling
PELCO® Modular SEM Sample Holders
APPLICATIONS: SEM FESEM, FIB/FIB/SEM
FEATURES: • Stage adapters for all major SEM brands • Large selection of effective and practical sample holders • Can be used on any SEM platform
TILL Photonics GmbH – An FEI Company
Tel: +49 89 895 662 0
Email: TILL-info@fei.com
Andromeda iMIC Spinning Disk Confocal
APPLICATIONS: • 3-D Life Cell Imaging • Fluorescence Microscopy • Inverted Microscopes • Spinning Disk Confocal Microscopy • Confocal Microscopes
FEATURES: Patented optical design, corrected for 400–640 nm, optimized: for CCD and EMCCD cameras, motorized filter wheels and dichroic slider, up to 10.000 rpm, perfect synchronisation
TMC
Tel: 800-542-9725/978-532-6330
Email: sales@techmfg.com
STACIS® iX SEM-Base™ Vibration Cancellation Floor Platform
APPLICATIONS: • SEM • Life Sciences • Materials Science • Semiconductors • Vibration Isolation Systems
FEATURES: Active vibration cancellation starts below 1 Hz, platform fits most commercial SEMs, load capacity 900 to 2,500 pounds, compatible with internal tool vibration isolation.
http://www.techmfg.com/products/floorplatforms/stacis_sem_base.html
Mag-NetX™ Magnetic Field Cancellation System
APPLICATIONS: • Magnetic Field • SEM • Electron Beam Litho • Ion Beam
FEATURES: Modular, interchangeable struts, integrated electronics, column, floor, or wall mounted, Helmholtz coil pairs for maximum symmetry and uniformity, dedicated controller with automated calibration.
XEI Scientific Inc.
Tel: 650-369-0133
Email: sales@Evactron.com
Evactron® 25 De-Contaminator
APPLICATIONS: SEM, FIB, and vacuum chamber remote plasma cleaner, Carbon removal from vacuum chamber
FEATURES: Uses air to make oxygen radicals • Preset cleaning recipes • Available computer interface • Simple operation • Table top controller
Evactron® 45 and 40 De-Contaminators
APPLICATIONS: SEM, FIB, and vacuum chamber remote plasma cleaners • Carbon removal from vacuum chamber
FEATURES: Use air • Preset cleaning recipes • Available computer interfaces • Simple operation • Rack mounted controllers
Evactron® Combiclean™ System
APPLICATIONS: Combines remote plasma cleaning of SEM, FIB, and vacuum chambers with onboard cleaning for carbon removal of samples and vacuum parts.
FEATURES: Switchable cleaning solutions • Integrated vacuum chamber • External Plasma Radical Source (PRS) for in-situ cleaning • Internal memory • Simple operation • Microprocessor regulates timer, RF power, and chamber pressure • Uses air for plasma • Backstreaming suppression for clean vacuum storage
Evactron® SoftClean™ Chamber
APPLICATIONS: Desktop plasma cleaning of specimens, Uses one PRS for SEM and specimen cleaning, Cleaning without sputter etching.
FEATURES: 3 ports for TEM stage holders • Top opening chamber lid for SEM samples • RF shield built into lid • Includes vacuum cutoff valve • Uses air for cleaning gas
Evactron® Plasma Radical Sources
APPLICATIONS: Make oxygen radicals from air or oxygen gas, Make hydrogen radicals from H2, Plasma light sources.
FEATURES: A variety of size and appearance options • Built-in pressure measurement • Built-in gas flow control • Compact size • Easy mounting
Xradia, Inc.
Tel: 925-701-3600
Email: bropoulos@xradia.com
VersaXRM
APPLICATIONS: • 3D X-ray Microscope • Multi-length Scale • Computed Tomography • 4D and In Situ Studies • Correlative Microscopy
FEATURES: Nondestructive X-ray. Two-stage magnification for true submicron spatial resolution and industry's largest working distances at highest resolution. Unique phase and propagation contrast for hard-to-image materials.
UltraXRM-L200
APPLICATIONS: • 3D X-ray Microscope • Nanoscale CT • Synchrotron-quality • Laboratory Instrument • Correlative Microscopy
FEATURES: Nondestructive imaging. Ultra-high resolution down to 50 nm. Integrated Zernike phase contrast imaging. Synchrotron-quality in a lab instrument. High-flux laboratory X-ray source with proprietary optics.
