No CrossRef data available.
Published online by Cambridge University Press: 14 March 2018
In the past few years the field of near-field scanning optical microscopy (NSOM) has developed rapidly with applications spanning all the physical sciences. A key goal of this form of microscopy is to obtain resolution at levels well beyond those possible with the usual far-field optics. In contrast to far-field optics, which is bounded by the well known limits imposed by diffraction, near-field optics has no “in principle” fundamental lower limit in lateral size, at least down to atomic dimensions, although in practice, signal-to-noise considerations may restrict the application of NSOM to a few nanometers.
1. D.W. Pohl nd D, Courjon, Eds. Near-field Optics, NATO ASI series: Applied Sciences, 242. (1993) Kluwer Academic Publishers. Also note that the most recent near-field conference was held in Brno Czech Republic, May, 1995.
2. Betzig, E., et al., ‘Breaking the diffraction barrier: optical microscopy on a nanometric scale ’. Science, 251, (1991) 1468Google ScholarPubMed.
3. Silva, T.J., et al., ‘Scanning near-field optical microscope for the imaging of magnetic domains in optically opaque materials ’, Appl. Phys. Lett., 65 (1994) 658 Google Scholar.
4. The author is pleased to acknowledge the collaboration of Dr. T.J. Silva, whose thesis project was the development of the Kerr plasmon based NSOM microscope. Support for the studies to be reported is by National Science Foundation grants DMR-93-02913 and DMR-94-00439.