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Phase Measurement in Electron Microscopy Using the Transport of Intensity Equation

Published online by Cambridge University Press:  14 March 2018

Kazuo Ishizuka  and
Brendan Allman
Kazuo Ishizuka*
Affiliation:
HREM Research Inc
Brendan Allman
Affiliation:
IATIA Ltd
*
ishizuka@hremresearch.com

Extract

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Although many samples in electron microscopy are phase objects, as in the case of optical microscopy, we cannot directly measure phase modulation by microscopy. Dennis Gabor proposed a technique called in-line holography to record both amplitude and phase information at the rather early stage of electron microscopy (in 1947). With the development of highly coherent field emission electron sources, another type of holography, off-axis holography, became available for electrons. However, holography cannot be applied to general cases, since there is a requirement for a vacuum region where the reference wave passes through.

Type
Research Article
Information
Microscopy Today , Volume 13 , Issue 3 , May 2005 , pp. 22 - 25
Copyright
Copyright © Microscopy Society of America 2005

References

[1] Teague, M.R., J. Opt. Soc. Am. 73 (1983) 1434-1441: Deterministic phase retrieval: a Green's function solution.CrossRefGoogle Scholar
[2] Ziegler, A., Kisielowski, C., Ritchie, R.O., Acta Materialia 50 (2002) 567- 574: Imaging of the crystal structure of silicon nitride at 0.8 Angstrom resolution.Google Scholar
[3]HREM Research Inc, Higashimatsuyama, 355-0055 Japan; www.hremresearch.com. Google Scholar