TESCAN’s SEM, FIB-SEM, and micro-CT instruments are capable of providing valuable insights into a broad range of scientific disciplines. From materials science to cellular biology, semiconductors, and geology, our instruments help unlock the secrets of “How” and “Why.”
TESCAN has developed state-of-the-art SEMs, FIB-SEMs, and micro-CTs that are capable of imaging with both high resolution and high contrast - some solutions will even enable observation of dynamic events in real-time. Furthermore, these systems have been designed to be extremely versatile, allowing customization of a system by adding imaging and microanalytical detection capabilities. This culmination of performance and versatility, produce intricate experimental capabilities that result in the most comprehensive analyses.
SEM, FIB-SEM and micro-CT solutions:
• TESCAN MAGNA – Triglav™ UHR SEM with TriLens™ immersion optics for characterization of nanomaterials
• TESCAN SOLARIS – Triglav™ An ultimate resolution FIB-SEM workbench for advanced nanofabrication applications
• TESCAN SOLARIS X – Triglav™ A Plasma FIB-SEM platform for deep sectioning and the highest resolution end-pointing for package level failure analysis
• TESCAN CLARA – BrightBeam™ Field-free analytical UHR-SEM for materials characterization at the nanoscale
• TESCAN AMBER – BrightBeam™ A field-free UHR-SEM combined with the most precise FIB for sample preparation, sub-surface and 3D analysis capabilities to take your materials nanocharacterization further
• TESCAN AMBER X – BrightBeam™ A unique combination of Plasma FIB and field-free UHR SEM for the widest range of multiscale materials characterization applications
• TESCAN TIMA – High speed measurement and analysis of large batches of mineralogy samples
• TESCAN CoreTOM – Multi-resolution 3D X-ray microscope optimized for high resolution, large field of view imaging of full cores down to microplugs
• TESCAN DynaTOM – Unique and first of its kind dedicated system for fast dynamic in situ imaging
• TESCAN UniTOM XL – Enables high-throughput non-destructive 3D imaging for materials research, failure analysis and quality assurance
• TESCAN VEGA – Analytical SEM for routine materials characterization, research and quality control applications at the micron scale
• TESCAN MIRA – Field-emission SEM with a flexible platform. It is a high-resolution analytical SEM for routine materials characterization, research and quality control applications at the sub-micron scale
The company is focused on research, development and the manufacturing of equipment for the following:
• Scanning electron microscopes and ion beam stations
• Ion beam technology
• X-ray micro-CT systems
• Special vacuum chambers and custom systems
• Supplementary accessories for SEM's
• Scientific software compatible with Windows upgrades
How to find us
TESCAN USA Inc.
765 Commonwealth Drive, Suite 101
Warrendale, PA 15086
Tel: 1-724-772-7433
Email: info@tescan.com
Web address: www.tescan.com
