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Toward Robust High Resolution Chemical Imaging

Published online by Cambridge University Press:  14 March 2018

Carlos A. Barrios
Affiliation:
Department of Polymer Science, The University of Akron, Akron, OHcab48@uakron.edu
Andrey V. Malkovskiy
Affiliation:
Department of Polymer Science, The University of Akron, Akron, OHcab48@uakron.edu
Alexander Kisliuk
Affiliation:
Department of Polymer Science, The University of Akron, Akron, OHcab48@uakron.edu
Alexei P. Sokolov
Affiliation:
Department of Polymer Science, The University of Akron, Akron, OHcab48@uakron.edu
Mark D. Foster
Affiliation:
Department of Polymer Science, The University of Akron, Akron, OHcab48@uakron.edu

Extract

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Resonant plasmon excitations at the surface of noble metals can localize and amplify an electromagnetic field in a very small volume and are the enabling element of surface enhanced optical microscopies. Tip enhanced Raman spectroscopy (TERS) combines scanning probe microscopy (SPM) with Raman spectroscopy, taking advantage of this enhancing mechanism. So far a 20 nm lateral resolution in chemical imaging of a surface has been achieved. So far a 20 nm lateral resolution in chemical imaging of a surface has been achieved.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2009

References

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[4] Barrios, C. A.; Malkovskiy, A. V.; Hartschuh, R. D.; Kisliuk, A. M.; Sokolov, A. P.; Foster, M. D. Proc. SPIE-Int. Soc. Opt. Eng. 2008, 6954, 69540C/1.Google Scholar
[5] Research support from the Army Research Office (W911NF-07-1-0470) is gratefully acknowledged.Google Scholar