Hostname: page-component-cd9895bd7-dzt6s Total loading time: 0 Render date: 2024-12-27T08:33:24.146Z Has data issue: false hasContentIssue false
  • English
  • Français

When Point To Point Is Not Enough

Published online by Cambridge University Press:  14 March 2018

Carol Heckman ,
Marilyn Cayer  and
Mita Varghese
Carol Heckman*
Affiliation:
Center for Microscopy & Microanalysis, Bowling Green State University, Bowling Green, OH
Marilyn Cayer
Affiliation:
Center for Microscopy & Microanalysis, Bowling Green State University, Bowling Green, OH
Mita Varghese
Affiliation:
Center for Microscopy & Microanalysis, Bowling Green State University, Bowling Green, OH
*
heckman@bgnet.bgsu.edu

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

As all microscopists are taught, resolution can be measured by knowing the closest distance between two points that can be discriminated in the image. There are some occasions when we want to measure something in a digital image, and the nominal resolution isn't sufficient for the task. One of these, extracting a contour from the image, was summarized in a previous research report. The principles would be valid for any filled area, such as a particle or structure from an X-ray dot map. The ground rule was set that the outermost pixel would be selected at every point on the contour. It was clear from the geometry shown in Fig. 1 that only values of 0°, 45°, 90°, 135° and 180° could be measured. Because of the stair step defect, tracing the sequence of pixel locations only gave offsets to 8 pixels, one directly below, two on the corners below, three pixels in the same location above, and one pixel on either side of the subject pixel. Therefore it was impossible to measure the true curvature of the contour.

Type
Microscopy 101
Information
Microscopy Today , Volume 14 , Issue 2 , March 2006 , pp. 48 - 50
Copyright
Copyright © Microscopy Society of America 2006

References

References:

1. Olson, O.C., Larson, N.M., and Heckman, C.A. (1980). Classification of cultured mammalian cells by shape analysis and pattern recognition. Proc.Natl.Acad.Sci. USA. 77, 1516–1520.Google Scholar
2. Heckman, C.A. and Jamasbi, R.J. (1999). Describing shape dynamics in transformed cells through latent factors. Experimental Cell Research. 246, 69–82.Google Scholar
3. Heckman, C.A., Plummer, H.K., and Mukherjee, R. (2000). Enhancement of the transformed shape phenotype by microtubule inhibitors and reversal by an inhibitor combination. International Journal of Oncology. 16, 709–723.Google ScholarPubMed