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Demountable polished extra-thin sections and their use in transmission electron microscopy

Published online by Cambridge University Press:  05 July 2018

D. J. Barber
D. J. Barber*
Affiliation:
Department of Physics, University of Essex, Wivenhoe Park, Colchester, CO4 3SQ
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Extract

The advantages of polished ultra-thin sections (PUTS) in the study of very fine-grained materials, such as occur in some meteorites, have been illustrated by Fredriksson et al. (1978) whose technique is based on the earlier work of Beauchamp and WiUiford (1974). An essential feature of such methods for friable and heterogeneous materials is the use of a medium, usually an epoxy resin, to consolidate and partially impregnate them. Normally one polished side of the specimen is bonded to a glass slide during preparation, and the finished PUTS are integral with the slide on completion. PUTS are typically 2-5 microns in thickness.

Type
Short Communications
Information
Mineralogical Magazine , Volume 44 , Issue 335 , September 1981 , pp. 357 - 359
Copyright
Copyright © The Mineralogical Society of Great Britain and Ireland 1981

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References

Barber, D. J. (1970). J. Mat. Sci. 5, 1-8.CrossRefGoogle Scholar
Beauchamp, R. H. and Williford, J. F. (1974). In McCall, J. A. and Mueller, W. M. (eds.), Metallographic specimen preparation: optical and electron microscopy, Plenum Press, New York and London.Google Scholar
Champness, P. E. (1977). Ann. Rev. Earth Planet. Sci. 5, 203-26.CrossRefGoogle Scholar
Fredriksson, K., Noonan, A. F., and Nelen, J. (1978). Meteoritics, 13, 46-24.Google Scholar
Moreland, G. and Johnson, R. (1977). Ibid. 12, 397-8.Google Scholar