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Anomalous Number Fluctuation Noise in Localized Transition Metal Dichalcogenide Layers: Generalization of McWhorter’s Mechanism

Published online by Cambridge University Press:  15 January 2018

Kimberly Hsieh*
Affiliation:
Department of Physics, Indian Institute of Science, Bangalore560012, India
Subhamoy Ghatak
Affiliation:
Department of Physics, Indian Institute of Science, Bangalore560012, India
Vidya Kochat
Affiliation:
Department of Material Science and NanoEngineering, Rice University, Houston, Texas77005, United States
Xiang Zhang
Affiliation:
Department of Material Science and NanoEngineering, Rice University, Houston, Texas77005, United States
Yongji Gong
Affiliation:
Department of Material Science and NanoEngineering, Rice University, Houston, Texas77005, United States
Chandra Sekhar Tiwary
Affiliation:
Department of Material Science and NanoEngineering, Rice University, Houston, Texas77005, United States
Sanjeev Kaushal
Affiliation:
Tokyo Electron Ltd., Akasaka Biz Tower, 3-1 Akasaka 5-Chome, Minato-ku, Tokyo107-6325, Japan
Pulickel M. Ajayan
Affiliation:
Department of Material Science and NanoEngineering, Rice University, Houston, Texas77005, United States
Arindam Ghosh
Affiliation:
Department of Physics, Indian Institute of Science, Bangalore560012, India Centre for Nano Science and Engineering, Indian Institute of Science, Bangalore560012, India
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Abstract

The mechanism of electrical noise in transition metal dichalcogenides (TMDCs) has mostly been attributed to charge carrier fluctuations between the oxide traps and the conducting channel, in accordance with the McWhorter model. However, the original McWhorter model was formulated for diffusive transport with conducting carriers having extended electronic wave functions. Our work serves to generalize the McWhorter mechanism to include strongly localized systems such as the TMDC family and provides an explanation for the unusual exponential behavior of noise magnitude with temperature.

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Articles
Copyright
Copyright © Materials Research Society 2018 

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References

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