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In-situ High Temperature X-ray Diffraction Study of the Am-O System
Published online by Cambridge University Press: 16 February 2017
Abstract
In the frame of minor actinide recycling, (U,Am)O2 are promising transmutation targets. To assess the thermodynamic properties of the U-Am-O system, it is essential to have a thorough knowledge of the binary phase diagrams, which is difficult due to the lack of thermodynamic data on the Am-O system. Nevertheless, an Am-O phase diagram modelling has been recently proposed by Gotcu. Here, we show a recent investigation of the Am-O system using in-situ High Temperature X-ray Diffraction under controlled atmosphere. By coupling our experimental results with the thermodynamic calculations based on the Gotcu model, we propose for the first time a relation between the lattice parameter and the departure from stoichiometry.
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- MRS Advances , Volume 1 , Issue 62: Scientific Basis for Nuclear Waste Management XXXIX , 2016 , pp. 4133 - 4137
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- Copyright © Materials Research Society 2017
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