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Optical Properties of Thin Films of Haycockite

Published online by Cambridge University Press:  13 June 2019

Barys Korzun ,
Marin Rusu ,
Thomas Dittrich ,
Anatoly Galyas  and
Andrey Gavrilenko
Barys Korzun*
Affiliation:
The City University of New York, Borough of Manhattan Community College, 199 Chambers St., New York, NY10007, U.S.A.
Marin Rusu
Affiliation:
Helmholtz-Zentrum Berlin fuer Materialen und Energie GmbH, Hahn-Meitner Platz 1, Berlin14109, Germany
Thomas Dittrich
Affiliation:
Helmholtz-Zentrum Berlin fuer Materialen und Energie GmbH, Hahn-Meitner Platz 1, Berlin14109, Germany
Anatoly Galyas
Affiliation:
Scientific-Practical Materials Research Centre of the National Academy of Sciences of Belarus, 19 P. Brovki, Minsk220072, Belarus
Andrey Gavrilenko
Affiliation:
Kazan State Power Engineering University, 51 Krasnoselskaya St., Kazan, 420066, Russia
*
*(Email: bkorzun@bmcc.cuny.edu)
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Abstract

Thin films of haycockite Cu4Fe5S8 on glass substrates were deposited by flash evaporation technique from powders of this compound. The composition of thin films correspond to the atomic content of Cu, Fe, and S of 24.13, 27.90, and 47.97 at.% with the Cu/ Fe and S/ (Cu + Fe) atomic ratios of 0.87 and 0.92 respectively, whereas the corresponding theoretical values for this material amount to 0.80 and 0.89. The as-prepared thin films of haycockite consist of a set of separate fractions of approximately identical areas of about 400 - 600 μm2. It can be assumed that this structure evolved during cooling down of thin films since it completely covers the surface of thin films. A small inclusion of a second phase with the chemical composition close to talnakhite Cu9Fe8S16 is also observed. Haycockite Cu4Fe5S8 is found to be a direct gap semiconductor with the energy band gap Eg equal to 1.26 eV as determined using both transmission and surface photovoltage methods.

Keywords

thin filmoptical propertiesscanning electron microscopy (SEM)
Type
Articles
Information
MRS Advances , Volume 4 , Issue 37: Energy and Sustainability , 2019 , pp. 2023 - 2033
Copyright
Copyright © Materials Research Society 2019 

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