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Effect of Ammonium Acetate Concentration on the Structural and Optical Properties of CdS Thin Film Grown by Chemical Bath Deposition Technique

Published online by Cambridge University Press:  18 May 2016

Hamda A. Al-Thani ,
Abeer A. Al Yafeai  and
Falah S. Hasoon
Hamda A. Al-Thani*
Affiliation:
National Energy and Water Research Center (NEWRC), POBOX 54111, Abu Dhabi, UAE
Abeer A. Al Yafeai
Affiliation:
National Energy and Water Research Center (NEWRC), POBOX 54111, Abu Dhabi, UAE
Falah S. Hasoon
Affiliation:
National Energy and Water Research Center (NEWRC), POBOX 54111, Abu Dhabi, UAE
*
*(Email: hamda369@hotmail.com)
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Abstract

This study focuses on understanding the influence of incorporating Ammonium Acetate into the chemical bath used for the deposition of CdS thin films, on its optical, morphology, and microstructural properties. Thus, CdS thin films were deposited on 1” × 2” microscopic glass substrates using chemical bath deposition (CBD) technique. The deposition process was carried out in a double jacket beaker with fixed chemical bath temperature of 90°C for a deposition time of 40 min. The chemical bath solution consisted of fixed concentrations of Cadmium Acetate, Thiourea, and Ammonium Hydroxide; with corresponding values of 4.8×10-4M; 0.97×10-4M; and 0.2M, respectively. However, Ammonium Acetate was incorporated into the deposition bath with concentrations that were varied from 3.0 mM to 12.2 mM. Meanwhile, for comparison purposes associated to the initial physical and chemical properties of the CdS films; reference CdS films were deposited under the same above chemical bath conditions, but in the absence of Ammonium Acetate. The pH of the chemical bath was measured during the deposition process. The films’ morphology and the chemical composition were examined by Field Emission Scanning Electron Microscopy (FE-SEM), and the Energy Dispersive spectrometer (EDS), respectively. The X-Ray Diffraction (XRD) θ/2θ technique was applied to study the structure of the films, including the lattice parameters. Atomic Force Microscopy (AFM) was used to examine the films topography and to determine the root-mean-square (RMS) surface roughness of the films as well as the grain size. Dektak Surface Profilometer was used to determine the CdS films’ thickness, where the films’ optical properties were measured using UV-Vis-NIR spectrometer. Optical energy band gap (Eg), and absorption coefficient (α) were calculated from the transmission spectral data.

Keywords

grain sizenucleation & ampgrowthphotovoltaic
Type
Articles
Information
MRS Advances , Volume 1 , Issue 37: Nanotechnology , 2016 , pp. 2603 - 2616
Copyright
Copyright © Materials Research Society 2016 

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References

REFERENCES

Liu, Q.Q., Shi, J.H., Li, Z.Q., Zhang, D.W., Huang, S.M.; J. Phys. B405 (2010), 4360–4365 Google Scholar
Liu, F., Lai, Y., Liu, J., Wang, B., Kuang, S., Zhang, Z., Li, J., Liu, Y., J.Alloys and Comp. 493 (2010) 305–308 Google Scholar
Zhou, Limei, Hu, Xiaofei, Wu, Sumei; Effects of Deposition Temperature on the Performance of CdS Films with Chemical Bath Deposition; J. Surface and Coating Technology 228 (2013), pp. 5171–5174 Google Scholar
Vigil, O, Zeleya-Angel, O, and Rodriguez, Y; Semicond. Sci. Technol. 15 (2000), p. 259.Google Scholar
Kaur, I., Pandya, D.K., and Chopra, K.L., J. Electrochem. Soc. 127, 943 (1980).Google Scholar
Lincot, D. and Vedel, J., Proc. 10th E.C. Photovolt. Solar Energy Conf., 931(1991).Google Scholar
Rose, D.H., Hasoon, F.S., Dhere, R.G., Albin, D.S., Ribelin, R.M., Li, X.S., Mahathongdy, Y., Gessert, T.A. and Sheldon, P.; Fabrication Procedures and Process Sensitivities for CdS/CdTe Solar Cells; Progress in Photovoltaics Research and Applications; Prog. Photovolt: Res. Appl. 7 (1999) pp. 331–340.Google Scholar
Lincot, D., Ortega-Borges, R., Vedel, J.; Ruckh, M., Kessler, J., Velthaus, K.O., Hariskos, D.-, Schock, H.W.; Chemical Bath Deposition of CdS on CuInSe2 Combining Dry and Wet Processes for high Efficiency Thin Film Solar Cells: Proceeding of 11th E.C.Photovoltaic Solar Energy Conference (1992); pp. 870–873.Google Scholar
Tomakin, M., Altunbas, A., Bacaksiz, E., Celik, S.; J. Thin Solid Films 520 (2012) 2532–2536.Google Scholar
Paudel, N.R., Wieland, K.A., Compaan, A.D.; J.Solar Ener. Mater. & Soalr Cells 105 (2012) 109–112.Google Scholar
Nishino, J., Chatani, S., Uotani, Y., Nosaka, Y.; J. Electroana. Chem. 473 (1999) 217–222.Google Scholar
Brunthaler, G., Lang, M., Forstner, A., Giftge, C., Schikora, D., Ferreira, S., Sitter, H., Lischka, K.; J.Cryst.Growth 138 (1994)559.Google Scholar
Vaudo, R.P., Eason, D.B., Bowers, K.A., Gosset, K.J., Cook, J.W., Schetsina, J.W.; J.Vac. Sci. Technol. B11 (1993) 875.CrossRefGoogle Scholar
Matsumoto, H., Nakayama, A., Ikegami, S., Hiori, Y.; Jpn. J. Appl. Phys. 15 (1980) 129.Google Scholar
Chou, H.C., Rohatgi, A., Thomas, E.W., Kamra, S., Bhat, A.K.; J.Electrochem Soc. 142 (1992) 254.Google Scholar
Chou, H.C., Rohatgi, A.; J. Electron. Mater. 23 (1994) 31.Google Scholar
Kwork, H. S., Zheng, J.P., Witanachchi, S., Mattocks, P., Shi, L., Ying, Q.Y., Wang, X.W., Shaw, D.T.; Appl. Phys. Lett. 52 (1988) 1095.Google Scholar
Chu, T.L., Britt, J., Ferekides, C., Wang, C., Wu, C.Q.; IEEE Trans. Electron. Device Lett. 13 (1992) 303.CrossRefGoogle Scholar
Bonilla, S., Dalchiele, E.A., Thin Solid Films 204 (1991) 397.Google Scholar
Green, M.A., Emery, K., Hishikawa, Y., Warta, W., and Dunlop, E.D., Solar Cell Efficiency Tables (version 46); Prog. Photovolt: Res. Appl.23 (2015) pp. 805–812.Google Scholar
Baumann, A.E., Hynes, K., and Herrero, J., Proc. 2nd World Conf. Photovolt. Solar Energy Conv., 735 (1998).Google Scholar
Barote, M.A., Yadav, A.A., Masumdar, E.U.; J.Phys. B 406 (2011) 1865–1871.Google Scholar
Prabahar, S., Dhanam, M.; J. Crys. Growth 285 (2005) 41–48.Google Scholar
Chu, T.L., Chu, S.S., Wu, C.Q., Britt, J., And Wang, C., in Proceedings of the 22nd IEEE Photovoltaic Specialists Conferences, (1991) 952.Google Scholar
Ortega-Borges, Raul and Lincot, Daniel; “Mechanism of Chemical Bath Deposition of Cadmium Sulfide Thin Films in the Ammonia-Thiourea System inSitue Kinetic Study and Modelization; J.Electrochem. Soc. Vol. 140, NO. 12 (1993) pp. 3464–3473.Google Scholar
Lincot, D. and Ortega-Borges, R., ibid, 139 (1992) 1880.Google Scholar
Choi, J.Y., Kim, K-J, Yoo, JI-B, and Kim, D.; Properties of Cadmium Sulfide Thin Films Deposited by Chemical Bath Deposition with Utrasonication; Solar Energy Vol. 64 Nos 1-3, (1998) pp. 41–47.CrossRefGoogle Scholar
Zhou, Limei, Hu, Xiaofei, Wu, Sumei; Effects of PH Value on Performance of CdS Films with Chemical Bath Deposition, Advanced Materials Research Vols. 557-559 (2012) pp. 1941–1944.Google Scholar
Kariper, A., Guneri, E., Gode, F., and Gumus, C.; Effect of PH on the Physical Properties of CdS Thin Films Deposited by CBD; Chalcogenide letters, Vol. 9, NO. 1 (2012). Pp. 27–40.Google Scholar
Munikrishna, R.Y., Nagendra, V.P.M, IOSR J.Appl. Phys. 4 (2013) 3464.Google Scholar
Mahanty, S., Basak, D., Rueda, F., and Leon, M.; J. Electron Mater.28 (1999) 559.Google Scholar
Lanning, B.R., Armstrong, J.H.; Int. J. Sol. Energy 12 (1992) 247.Google Scholar
Oladeji, I.O., Chow, L., Liu, J.R., Chu, W.K., Bustamante, A.N.P., Fredricksen, C., Schulte, A.F.; Thin Solid Films 359 (2000) 154–159.Google Scholar
Oladeji, I.O. and Chow, L.; Optimization of Chemical Bath Deposited Cadmium Sulfide Thin Films; J. Electrochem. Soc. Vol. 144, NO. 7 (1997).CrossRefGoogle Scholar
Chu, T.L., Chu, Shirley S., Schultz, N., Wang, C., and Wu, C.Q.; “Solution Grown Cadmium Sulfide Films for Photovoltaic Devices”, J. Electrochem. Soc. Vol. 139, NO.9, (1992), pp. 2443–2446.Google Scholar
Kylner, A., Rockett, A., and Stolt, L., “Oxygen in Solution Grown CdS Films for Thin Film Solar Cells, Solid State Phenomena Vols. 51-52 (1996) pp. 533–540.Google Scholar
Kylner, A. and Wirde, Mikael; “A High Resolution X-Ray Photoelectron Spectroscopy Study of Carbon-Nitrogen Impurity in Chemical Bath Deposited CdS Thin Films”; Jpn. J. Appl. Phys. Vol. 36 (1997) pp. 2167–2175.Google Scholar
Kylner, A., and Niemi, E., “Chemical Bath Deposited CdS films with Different impurity Concentrations – Film Characterization and Cu(In,Ga)Se2 Solar Cell Results”14th European photovoltaic Solar Energy Conference, Parcelona, Spain (1997) pp. 1326–1329.Google Scholar
Machlin, E.S., Materials Science in Microelectronics: The Relationships between Thin Film Processing and Structure (Giro Press, N.Y., 1995).Google Scholar
Thompson, C.V., J. Appl. Phys. 58, 763 (1985).Google Scholar
Thompson, C.V., Annu. Ref. Mater. Sci. 20, 245 (1990).Google Scholar
Wong, C.C., Smith, H.I., and Thompson, C.V., Appl. Phys. Lett. 48, 335 (1986).Google Scholar
Hasoon, F.S., Al-Jassim, M.M., Swartzlander, A., Sheldon, P., Al-Douri, A.A., and Alnajjar, A.A., “The morphology of CdS Thin Films Deposited on SnO2-Coated Glass Substrates”, 26th IEEE PVSC, Anaheim, California (1997). NREL Report NO.CP-530–23580.Google Scholar
Webb, J.D., Rose, D.H., Niles, D.W., Swartzlander, A., and Al-Jassim, M.M., Proceedings 26th IEEE PVSC. (1997). P. 399.Google Scholar
PeakFit V4.11: Peak Separation and Analysis Software, Manufactured by SYSTAT Software Inc. For more information visit WWW. Site at http://www.systatsoftware.com; accessed on March 25th, 2016.Google Scholar
Cullity, B.D. and Stock, S.R., Elements of X-Ray Diffraction, 3 rd ed. (Prentice Hall, NY, 2001).Google Scholar
Mathematica V4.2 software, Manufactured by Wolfram Research Inc. For more information visit www. Site at http://www.wolfram.com; accessed on March 25th, 2016.Google Scholar
Kaneko, H., Hasunuma, M., Sawabe, A., Kawanoue, T., Kohanawa, Y., Komatsu, S., and Miyauchi, M., Proc. IEEE/IRPS, 194 (1990).Google Scholar
Liu, X. L., Zhu, Y.J., Valdna, V., Mater. Lett. 63 (2009) 1085.Google Scholar
Shannon, R.D., “Revised Effective Ionic Radii and Systematic Studies of Interatomic Distances in Halides and Chalcogenides”. Acta Cryst A32 (1976) pp. 751–767.Google Scholar
Al-Jassim, M.M., Dhere, R.G., Jones, K.M., Hasoon, F.S., Sheldon, P., “The Morphology, Microstructure, and Luminescent Properties of CdS/CdTe Films”, Proceeding of 2nd World Conference and Exhibition on Photovoltaic Solar Energy Conversion, Vienna, Austria (1998).Google Scholar
Jimenez-Sandoval, S., Melendez-Lira, M., and Hernandez-Calderon, I., “Crystal Structure and Energy Gap of CdTe Thin Films Grown by Radio Frequency Sputtering”, J.Appl. Phys. 72 (9), (1992), pp.4197–4202.Google Scholar
Ozsan, M.E., Johnson, D.R., Sadeghi, M., Sivapathasundaram, D., Goodlet, G., Furlong, M.J., Peter, L.M., Shingleton, A.A., “Optical and Electrical Characterization of CdS Thin Films”, Journal of Materials Science: Materials in Electronics 7(1996) pp. 119–125 Google Scholar
Berger, L.I., Semiconductor Materials (CRC Press, Florida, 1997).Google Scholar