Hostname: page-component-cd9895bd7-dk4vv Total loading time: 0 Render date: 2024-12-28T06:58:13.378Z Has data issue: false hasContentIssue false
  • English
  • Français

Improvement of Mixing Conductance and Spin-Seebeck Effect at Fe Interface Treatment

Published online by Cambridge University Press:  10 May 2016

Y. Iwasaki ,
M. Ishida ,
A. Kirihara ,
K. Ihara ,
H. Someya ,
K. Uchida ,
E. Saitoh ,
T. Murakami  and
S. Yorozu
Y. Iwasaki*
Affiliation:
Smart Energy Research Laboratories, NEC Corporation, Tsukuba 305-8501, Japan
M. Ishida
Affiliation:
Smart Energy Research Laboratories, NEC Corporation, Tsukuba 305-8501, Japan Spin Quantum Rectification Project, ERATO, JST, Sendai 980-8577, Japan
A. Kirihara
Affiliation:
Smart Energy Research Laboratories, NEC Corporation, Tsukuba 305-8501, Japan Spin Quantum Rectification Project, ERATO, JST, Sendai 980-8577, Japan
K. Ihara
Affiliation:
Smart Energy Research Laboratories, NEC Corporation, Tsukuba 305-8501, Japan Spin Quantum Rectification Project, ERATO, JST, Sendai 980-8577, Japan
H. Someya
Affiliation:
Smart Energy Research Laboratories, NEC Corporation, Tsukuba 305-8501, Japan Spin Quantum Rectification Project, ERATO, JST, Sendai 980-8577, Japan
K. Uchida
Affiliation:
Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan PREST, JST, Saitama 332-0012, Japan
E. Saitoh
Affiliation:
Spin Quantum Rectification Project, ERATO, JST, Sendai 980-8577, Japan Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan WPI Advanced Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan Advanced Science Research Center, Japan Atomic Energy Agency, Tokai, 319-1195, Japan
T. Murakami
Affiliation:
Smart Energy Research Laboratories, NEC Corporation, Tsukuba 305-8501, Japan
S. Yorozu
Affiliation:
Smart Energy Research Laboratories, NEC Corporation, Tsukuba 305-8501, Japan Spin Quantum Rectification Project, ERATO, JST, Sendai 980-8577, Japan
*
*(Email: amadole0127@gmail.com)
Get access

Abstract

In the previous work, it is reported that the Spin-Seebeck effect (SSE), which refer to the generation of a spin current from a temperature gradient, can be enhanced by Fe interface treatment. Here, we investigated the Fe thickness (dFe) dependency of spin-Seebeck voltage (VSSE) and mixing conductance (gr) in Pt/Fe/Bi:YIG/SGGG system. As a result, magnitude of VSSE had a peak at dFe ≓ 1 ML (monolayer , ≓ 0.3 mm), and also increase of gr was saturated at this point. It suggests that VSSE increase with increasing gr when dFe is smaller than 1.0 ML. For the case in which dFe is larger than 1.0ML, however, VSSE decreases due to a spin current decay in Fe layer with a constant gr. These experimental results are consistent with previous theoretical works.

Keywords

spintronicthermoelectricenergy generation
Type
Articles
Information
MRS Advances , Volume 1 , Issue 60: Energy and Sustainability , 2016 , pp. 3959 - 3964
Copyright
Copyright © Materials Research Society 2016 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Bell, L. E., Science 321, 1457–1461 (2008).Google Scholar
Uchida, K., Takahashi, S., Harii, K., Ieda, J., Koshibae, W., Ando, K., Maekawa, S., and Saitoh, E., Nature 455, 778 (2008).CrossRefGoogle Scholar
Xiao, J., Bauer, G. E. W., Uchida, K., Saitoh, E., and Maekawa, S., Phys. Rev. B 81, 214418 (2010).Google Scholar
Uchida, K., Xiao, J., Adachi, H., Ohe, J., Takahashi, S., Ieda, J., Ota, T., Kajiwara, Y., Umezawa, H., Kwai, H., Bauer, G. E. W., Maekawa, S., and Saitoh, E., Nat. Mater. 9, 894 (2010).Google Scholar
Jaworski, C. M., Yang, J., Mack, S., Awschalom, D. D., Heremans, J. P., and Myers, R. C., Nat. Matt. 9, 898 (2010).Google Scholar
Uchida, K., Adachi, H., Ota, T., Nakayama, H., Maekawa, S., and Saitoh, E., Appl. Phys. Lett. 97, 172505 (2010).CrossRefGoogle Scholar
Adachi, H., Ohe, J., Takahashi, S., and Maekawa, S., Phys. Rev. B 83, 094410 (2011).Google Scholar
Jaworski, C. M., Yang, J., Mack, S., Awschalom, D. D., Myers, R. C., and Heremans, J. P., Phys. Rev. Lett. 106, 186601 (2011).CrossRefGoogle Scholar
Kikkawa, T., Uchida, K., Shiomi, Y., Qiu, Z., Hou, D., Tian, D., Nakayama, H., Jin, X.-F., and Saitoh, E., Phys. Rev. Lett. 110, 067207 (2013).Google Scholar
Meier, D., Kuschel, T., Shen, L., Gupta, A., Kikkawa, T., Uchida, K., Saitoh, E., Schmalhorst, J.-M., and Reiss, G., Phys. Rev. B 87, 054421 (2013).Google Scholar
Kirihara, A., Uchida, K., Kajiwara, Y., Ishida, M., Nakamura, Y., Manako, T., Saitoh, E., and Yorozu, S., Nat. Mater. 11, 686 (2012).Google Scholar
Azevedo, A., Vilela Leão, L. H., Rodriguez-Suarez, R. L., Oliveira, A. B., and Rezende, S. M., J. Appl. Phys. 97, 10C715 (2005).Google Scholar
Saitoh, E., Ueda, M., Miyajima, H., and Tatara, G., Appl. Phys. Lett. 88, 182509 (2006).CrossRefGoogle Scholar
Valenzuela, S. O., and Tinkham, M., Nature 442, 176 (2006).CrossRefGoogle Scholar
Costache, M. V., Sladkov, M., Watts, S. M., van der Wal, C. H., and van Wees, B. J., Phys. Rev. Lett. 97, 216603 (2006).Google Scholar
Kimura, T., Otani, Y., Sato, T., Takahashi, S., and Maekawa, S., Phys. Rev. Lett. 98, 156601 (2007).CrossRefGoogle Scholar
Jia, X., Liu, K., Xia, K., and Bauer, G. E. W., Europhys. Lett. 96, 17005 (2011).Google Scholar
Kikuchi, D., Ishida, M., Uchida, K., Qiu, Z., Murakami, T., and Saitoh, E., Appl. Phys. Lett. 106, 082401 (2015).Google Scholar
Ishibashi, T., Mizusawa, A., Nagai, M., Shimizu, S., Sato, K., Togashi, M., Mogi, T., Houchido, M., Sano, H., and Kuriyama, K., J. Appl. Phys. 97, 013516 (2005).CrossRefGoogle Scholar
Ando, K., and Saitoh, E., J. Appl. Phys. 108, 113925 (2010).CrossRefGoogle Scholar