Published online by Cambridge University Press: 07 January 2016
Scintillation properties are often studied by photo-luminescence (PL) andscintillation measurements. In this work, we combine X-ray-induced luminescence(XRIL) spectroscopy [Review of Scientific Instruments 83, 103112 (2012)] with PLand standard scintillation measurements to give insight into the scintillationproperties of un-doped ZnO single crystals. XRIL revealed that ZnO luminescenceproportionally increases with X-ray power and exhibits excellent linearity -indicating the possibility of developing radiation detectors with good energyresolution. By coupling ZnO crystals to fast photomultiplier tubes andmonitoring the anode signal, rise times as fast as 0.9 ns were measured.