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Tip Induced Surface Defect migration and Conductivity Studies in Tetragonal, Rhombohedral and Mixed-Phase epitaxial BiFeO3 Thin Films

Published online by Cambridge University Press:  24 May 2018

M M Saj Mohan ,
M V Sreenath  and
Ranjith Ramadurai
M M Saj Mohan*
Affiliation:
Department of Materials Science and Metallurgical Engineering, IIT Hyderabad, Sangareddy, Kandi, Telangana, India-502285.
M V Sreenath
Affiliation:
Department of Materials Science and Metallurgical Engineering, IIT Hyderabad, Sangareddy, Kandi, Telangana, India-502285.
Ranjith Ramadurai
Affiliation:
Department of Materials Science and Metallurgical Engineering, IIT Hyderabad, Sangareddy, Kandi, Telangana, India-502285.
*
*(Email: ms13p1006@iith.ac.in)
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Abstract

BiFeO3 (BFO) is the most studied room temperature multiferroic compound. In this work we demonstrate a template assisted growth process through which the growth strain is controlled to achieve required phase of BFO. Growth of (∼20nm) fully strained tetragonal (T), rhombohedral (R) and mixed phase of T and R of Bismuth ferrite (BiFeO3) was achieved by varying the thickness of the template layer. The different phases were confirmed by using high resolution x-ray diffractions studies. The conductivity map of all the three phases were carried out using an atomic force microscope operating in conductive mode. Tip induced surface defect migration within a given grain was observed in pure phases and the conductivity map confirmed the same. The room temperature resistivity is found to be decreasing systematically from 1.1×106 Ωm , 935×105 Ωm and 1.16×104 Ωm respectively for tetragonal, mixed phase and rhombohedral phase BFO. In the case of mixed phase both the nano- scale and macroscopic leakage current studies show low conductivity, which could be due to the increased pinning sites that increases the energy barrier for the defect migration. The local nano-scale measurements and conductivity mapping corroborates well with the macroscopic studies.

Keywords

ferroelectricepitaxythin filmscanning probe microscopy (SPM)
Type
Articles
Information
MRS Advances , Volume 3 , Issue 44: Characterization, Modeling and Theory , 2018 , pp. 2713 - 2718
Copyright
Copyright © Materials Research Society 2018 

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