Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Kushwaha, A.
Gerhardt, R.A.
Kim, Y.
and
Erbril, A.
1996.
Electrical characterization of MOCVD grown epitaxial and polycrystalline PLT thin films.
Vol. 1,
Issue. ,
p.
337.
Tung-Sheng Chen
Hadad, D.
Balu, V.
Jiang, B.
Shao-Hong Kuah
McIntyre, P.C.
Summerfelt, S.R.
Anthony, J.M.
and
Lee, J.C.
1996.
Ir-electroded BST thin film capacitors for 1 giga-bit DRAM application.
p.
679.
Summerfelt, Scott R.
1997.
Thin Film Ferroelectric Materials and Devices.
p.
1.
Wu, Chii-Ming
and
Wu, Tai-Bor
1997.
Low temperature deposition of Ba0.4Sr0.6TiO3 thin films on LaNiO3-buffered electrode by rf magnetron sputtering.
Materials Letters,
Vol. 33,
Issue. 1-2,
p.
97.
Petrovsky, V.
Anderson, H.U.
and
Shumsky, M.
1997.
Ferroelectric films as a Fashion Object for Polycrystalline Film Investigation.
MRS Proceedings,
Vol. 472,
Issue. ,
Wang, C H
Jackson, T J
Somekh, R E
Leake, J A
and
Evetts, J E
1997.
Linked magnetron sputtering and pulsed laser deposition UHV chambers for the preparation of epitaxial metal/metal oxide thin film multilayers.
Measurement Science and Technology,
Vol. 8,
Issue. 9,
p.
978.
Shen, H.
Kotecki, D. E.
Murphy, R. J.
Zaitz, M.
Laibowitz, R. B.
Shaw, T. M.
Saenger, K. L.
Baniecki, J.
Beitel, G.
Klueppel, V.
and
Cerva, H.
1997.
Microstructure Control of (Ba, Sr)TiO3 Films for Gigabit Dram.
MRS Proceedings,
Vol. 493,
Issue. ,
Sun, S.C.
and
Tsai, M.S.
1997.
The electrical and reliability effect of bottom electrode materials characteristics of (Ba,Sr)TiO/sub 3/ capacitors.
p.
253.
Zafar, Sufi
Chu, Peir
Remmel, T.
Jones, Robert E.
White, Bruce
Gentile, David
Jiang, Bo
Melnick, Bradley
Taylor, Deborah
Zurcher, Peter
and
Gillespie, Sherry
1997.
Investigation of Dielectric Constant and Dispersion in Barium Strontium Titanate Capacitors.
MRS Proceedings,
Vol. 493,
Issue. ,
Hoffmann, T.
and
Fuenzalida, V. M.
1997.
Microstructures in thin BaTiO3 Films by Hydrothermal Method.
MRS Proceedings,
Vol. 495,
Issue. ,
Kumar, Ashok
Rahman, H.
and
Shamsuzzoha, M.
1998.
Fabrication of PZT Based Capacitor with SrRuO3 Electrode for Memory Device Applications.
MRS Proceedings,
Vol. 541,
Issue. ,
Srivastava, Anuranjan
Kumar, D.
and
Singh, Rajiv K.
1998.
Studies of Dielectric Properties of Pulsed Laser Deposited (Ba, Sr)TiO3 Films Using LaNiO3 as Conductive Electrode.
MRS Proceedings,
Vol. 541,
Issue. ,
Kumar, Ashok
Alam, M.R.
and
Shamsuzzoha, M.
1998.
Growth, Microstructural and Ferroelectric Properties of PZT Films Prepared by Pulsed Laser Deposition Method.
MRS Proceedings,
Vol. 541,
Issue. ,
Kumar, Ashok
and
Alam, M.R.
1998.
Synthesis and Characterization of Ferroelectric Thin Films by KrF Excimer Laser Ablation for Memory Applications.
MRS Proceedings,
Vol. 526,
Issue. ,
Jia, C. L.
Urban, K.
Hoffmann, S.
and
Waser, R.
1998.
Microstructure of columnar-grained SrTiO3 and BaTiO3 thin films prepared by chemical solution deposition.
Journal of Materials Research,
Vol. 13,
Issue. 8,
p.
2206.
Chen, Y.M.
Ritums, D.
Wu, N.J.
and
Ignatiev, A.
1998.
Dielectric properties of (Ba,Sr)TiO/sub 3/ thin films deposited on Ni/TiN/Si substrate by photo-assisted metal organic chemical vapor deposition.
p.
43.
Wu, Tai-Bor
Wu, Chii-Ming
and
Chen, Mei-Ling
1998.
Dielectric and leakage current characteristics of Ba(Ti1-xZrx)O3 thin films deposited by rf magnetron sputtering.
Thin Solid Films,
Vol. 334,
Issue. 1-2,
p.
77.
Zhuang, W. W.
Wu, N. J.
Ritums, D.
and
Ignatiev, A.
1998.
The integration of Ba0.5Sr0.5TiO3 with silicon by the use of metallic buffers.
Integrated Ferroelectrics,
Vol. 21,
Issue. 1-4,
p.
167.
Lee, Jian-Hung
Chen, Tung-Sheng
Balu, Venkatasubramani
Han, Jeong
Mohammedali, Razak
Gopalan, Sundar
Wong, Chun-Hui
and
Lee, Jack C.
1998.
Study of Rf-Sputtered Ba(ZrxTi1−x)O3 Thin Films for Ulsi Dram Application.
MRS Proceedings,
Vol. 541,
Issue. ,
Jackson, T.J
Glowacki, B.A
and
Evetts, J.E
1998.
Oxidation thermodynamics of metal substrates during the deposition of buffer layer oxides.
Physica C: Superconductivity,
Vol. 296,
Issue. 3-4,
p.
215.