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Quantifying SERS enhancements

Published online by Cambridge University Press:  09 August 2013

Eric C. Le Ru  and
Pablo G. Etchegoin
Eric C. Le Ru
Affiliation:
School of Chemical and Physical Sciences, MacDiarmid Institute for Advanced Materials and Nanotechnology, Victoria University of Wellington, New Zealand; eric.leru@vuw.ac.nz
Pablo G. Etchegoin
Affiliation:
School of Chemical and Physical Sciences, MacDiarmid Institute for Advanced Materials and Nanotechnology, Victoria University of Wellington, New Zealand
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Abstract

We provide a review of the main aspects related to surface-enhanced Raman scattering (SERS) enhancement factors (EFs), from their origins to the important issue of their practical quantification. The discussion also focuses on correcting some long-held misconceptions regarding the EFs in SERS, which still persist through the literature. We explain the main topics in simple terms, aiming at clarification of basic concepts rather than an in-depth overview of the already existing literature.

Keywords

Raman spectroscopynanostructuresensormetalcolloid
Type
Research Article
Information
MRS Bulletin , Volume 38 , Issue 8: Surface-enhanced Raman spectroscopy: Substrates and materials , August 2013 , pp. 631 - 640
Copyright
Copyright © Materials Research Society 2013 

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