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An in Situ Electron Microscopy Technique for the Study of Thermally Activated Reactions in Multilayered Materials

Published online by Cambridge University Press:  15 February 2011

M.A. Wall ,
T.W. Barbee Jr.  and
T.P. Weihs
M.A. Wall
Affiliation:
Chemistry and Materials Science Department, L-350 Lawrence Livermore National Laboratory Livermore, CA. 94550
T.W. Barbee Jr.
Affiliation:
Chemistry and Materials Science Department, L-350 Lawrence Livermore National Laboratory Livermore, CA. 94550
T.P. Weihs
Affiliation:
Chemistry and Materials Science Department, L-350 Lawrence Livermore National Laboratory Livermore, CA. 94550
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Abstract

A novel in situ transmission electron microscopy technique for the observation of reaction processes in multilayered materials is reported. The technique involves constantheating rate experiments of multilayered materials in image and diffraction modes. Because the fine scale microstructure of multilayered materials is typically a small fraction of the TEM specimen thickness, realistic comparison of the microstructural evolution with that of similarly processed thick foil samples is possible. Such experiments, when well designed, can provide rapid characterization of phase transformations and stability of nano-structured materials. The results of these experiments can be recorded in both video and micrograph format. The results and limitations of this technique will be shown for the Al/Zr and A1/Monel multilayered systems.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 382: Symposium G – Structure and Properties of Multilayered Thin Films , 1995 , 179
Copyright
Copyright © Materials Research Society 1995

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References

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