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Characterization of the Structure and Interfaces in Metallic Superlattices

Published online by Cambridge University Press:  25 February 2011

Jeha Kim ,
John R. Dutcher ,
Sukmock Lee ,
George I. Stegeman  and
Charles M. Falco
Jeha Kim
Affiliation:
Department of Physics and Optical Sciences Center, University of Arizona, Tucson, AZ 85721
John R. Dutcher
Affiliation:
Department of Physics, University of Guelph, Guelph, Ontario, Canada, NIG 2W1
Sukmock Lee
Affiliation:
CREOL, University of Central Florida, 12424 Research Parkway, Orlando, FL 32826
George I. Stegeman
Affiliation:
CREOL, University of Central Florida, 12424 Research Parkway, Orlando, FL 32826
Charles M. Falco
Affiliation:
Department of Physics and Optical Sciences Center, University of Arizona, Tucson, AZ 85721
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Abstract

Using magnetically enhanced dc-triode sputtering we have grown metallic multilayers of Ag/Pd and Cu/Pd with modulation wavelengths A ranging from 10 Å to 120 Å. The Ag/Pd films were prepared with two different thickness ratios of silver to palladium (1:1 and 3:1) while the Cu/Pd films all were 1:1. We observed in the Ag/Pd films that the variation with A of the (111) lattice spacing dav in the growth direction is less than 0.5%, independent of the composition. However, these films exhibited enhancements in the Rayleigh sound velocity vR of up to 22% for the 1:1 samples and 13% for the 3:1 Ag/Pd samples respectively as A decreased. The Cu/Pd films showed a slight systematic dependence of dav on A, although its variation was only approximately 0.7%. A softening in vR of up to 7% for the Cu/Pd samples was observed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 202: Symposium C – Evolution of Thin Film and Surface Microstructure , 1990 , 691
Copyright
Copyright © Materials Research Society 1991

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References

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