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Evolution of Interfacial Roughness Correlations of Fe Au Films Grown on Mgo(001) Substrates

Published online by Cambridge University Press:  15 February 2011

P. C. Chow ,
R. Paniago ,
R. Forrest ,
S. C. Moss ,
S. S. P. Parkin  and
D. Cookson
P. C. Chow
Affiliation:
Department of Physics, University of Houston, Houston, TX 77204-5506
R. Paniago
Affiliation:
Department of Physics, University of Houston, Houston, TX 77204-5506
R. Forrest
Affiliation:
Department of Physics, University of Houston, Houston, TX 77204-5506
S. C. Moss
Affiliation:
Department of Physics, University of Houston, Houston, TX 77204-5506
S. S. P. Parkin
Affiliation:
IBM Almaden Research Center, 650 Harry Road, San Jose, CA 95120-6099
D. Cookson
Affiliation:
ANSTO, Private Mail Bag 1, Menai 2234, Australia
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Abstract

The growth by sputtering of a series of thin films of Fe/Au on MgO(001) substrates was analyzed using Bragg and diffuse X-ray scattering. The Fe (bcc) layer grows rotated by 45° with respect to the MgO – Au(fcc) (001) epitaxial orientation, resulting in an almost perfect match between the two metallic structures. By collecting the X-ray diffuse scattering under grazing incidence using a 2-dimensional image plate detector, we mapped the reciprocal space of these films. We characterized the correlated interface roughness starting with a buffer of Fe in which only three interfaces are present. The propagation of the roughness was subsequently characterized for Fe/Au multilayers with 40 and 100 bilayers. We observe an enlargement of the surface features as a function of time, evidenced by the longer lateral cutoff length measured for thicker films.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 440: Symposia CA – Structure and Evolution of Surfaces , 1996 , 359
Copyright
Copyright © Materials Research Society 1997

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