Published online by Cambridge University Press: 28 February 2011
Local variation of photoluminescence (PL) spectra for MBE GaAs grown on an insulating substrate with Ge-islands interface layers, prepared by zone melting recrystallization, has been investigated. The GaAs layers on the single crystalline Ge islands emit PL, the intensity of which was almost comparable to that of the GaAs layers on bulk Ge, while by a factor of 50 lower PL intensity was observed for the GaAs layers on Si02. PL spectra were found to show peak shifts due to the band-gap variation near the interface layer of GaAs, which was in good agreement with the residual strain obtained by microprobe Raman scattering for underlying Ge islands.