Hostname: page-component-745bb68f8f-l4dxg Total loading time: 0 Render date: 2025-01-15T06:44:09.013Z Has data issue: false hasContentIssue false
  • English
  • Français

Ion Beam Damage of Clean Gold Surfaces

Published online by Cambridge University Press:  25 February 2011

D. N. Dunn ,
J. P. Zhang  and
L. D. Marks
D. N. Dunn
Affiliation:
Marks Northwestern University, Department of Materials Science and Engineering, 2145 Sheridan Road Evanston, Ill. 60208
J. P. Zhang
Affiliation:
Marks Northwestern University, Department of Materials Science and Engineering, 2145 Sheridan Road Evanston, Ill. 60208
L. D. Marks
Affiliation:
Marks Northwestern University, Department of Materials Science and Engineering, 2145 Sheridan Road Evanston, Ill. 60208
Get access

Abstract

We investigate the ion beam damage of clean Au (001) single crystals prepared under standard surface science techniques using sputter - anneal cycles. Under initial ion milling conditions using 4 keV Xe ions a significant amount of Xe was implanted into the bulk of the crystal. After a short period of time a Xe super structure developed which yielded 12 Å moire fringes under bright field imaging conditions. With a short anneal the implanted Xe concentration was reduced to the detection limit of Parallel Electron Energy Loss Spectroscopy (PEELS). With extended annealing, the bulk point defect concentration slowly decayed, independent of the surface reconstruction.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 202: Symposium C – Evolution of Thin Film and Surface Microstructure , 1990 , 433
Copyright
Copyright © Materials Research Society 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Michely, T., H, K. and Comsa, G., Surface Science Letters 230, L135 (1990).Google Scholar
[2] Pelsema, B., Lenz, K., et al., Surface Science 162, 2500 (1984).Google Scholar
[3] N, D., P, J. and D, L., M.R.S. Fall Meeting, (1990).Google Scholar