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Probability of Detection of Internal Voids in Structural Ceramics Using Microfocus Radiography

Published online by Cambridge University Press:  28 February 2011

George Y. Baaklini  and
Don J. Roth
George Y. Baaklini
Affiliation:
Cleveland State University, Cleveland, OH 44115
Don J. Roth
Affiliation:
Lewis Research Center, Cleveland, OH 44135
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Abstract

The reliability of mlcrofocus x-rad1ogrphy for detecting Internal voids 1n structural ceramic test specimens was statistically evaluated. The micro-focus system was operated in the projection mode using low x-ray photon energies (≤;20 keV) and a 10 μm focal spot. The statistics were developed for Implanted Internal voids 1n green and sintered silicon carbide and silicon nitride test specimens. These statistics were compared with previously-obtained statistics for implanted surface voids in similar specimens. Statistical results are given as probability-of-detection curves at a 95 percent confidence level for voids ranging in size from 20 to 528 μm in diameter.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 60: Symposium L – Defect Properties and Processing of High-Technology Nonmetallic Materials , 1985 , 273
Copyright
Copyright © Materials Research Society 1986

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