Published online by Cambridge University Press: 16 February 2011
An overview is given on the time and carrier density range covered by steady-state and transient photocarrier grating experiments which are commonly used to determine ambipolar transport parameters. In addition to the optically-detected transient grating method we discuss some details of a new version of the transient grating Method, the electrically-detected transient grating technique (EDTG) applied to hydrogenated Amorphous and microcrystalline silicon films. Numerical simulation shows that the diffusion coefficient is time and intensity dependent as expected for dispersive transport.