Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-10T02:48:28.881Z Has data issue: false hasContentIssue false
  • English
  • Français

C-Axis Perpendicularly Oriented Barium Ferrite Thin Film Media On Silicon Substrate

Published online by Cambridge University Press:  21 February 2011

Zailong Zhuang ,
Mark H. Kryder ,
Robert M. White  and
David E. Laughlin
Zailong Zhuang
Affiliation:
Department of Electrical and Computer Engineering Data Storage Systems Center, Carnegie Mellon University, Pittsburgh, PA 15213-3890
Mark H. Kryder
Affiliation:
Department of Electrical and Computer Engineering Data Storage Systems Center, Carnegie Mellon University, Pittsburgh, PA 15213-3890
Robert M. White
Affiliation:
Department of Electrical and Computer Engineering Data Storage Systems Center, Carnegie Mellon University, Pittsburgh, PA 15213-3890
David E. Laughlin
Affiliation:
Department of Materials Science and Engineering
Get access

Abstract

Barium ferrite thin films with excellent perpendicular c-axis orientation were successfully fabricated on Si substrate without any buffer layer. To compensate for possible barium deficiency due to the inter-diffusion between films and substrate, a barium-rich target was used. For a 900 Å-thick film, the perpendicular remanent squareness is about 0.9, while the in-plane remanent squareness is about 0.3. The saturation magnetization (Ms) is about 220 emu/cc, while the coercivity is around 3500 Oe. X-ray diffraction (XRD) results show the (001) perpendicular c-axis texture in the films. It was also found that the rapid thermal annealing conditions greatly affect the magnetic properties of barium ferrite films. With a certain flow rate of oxygen gas in the rapid thermal annealer (RTA), barium ferrite films generally crystallize with good perpendicular c-axis texture. Without oxygen gas, the hexagonal barium ferrite phase fails to develop; instead spinel Fe 30 4 phase forms. The reason for the collapsing of hexagonal barium ferrite texture is thought to be an oxygen deficiency in the barium ferrite films due to the reduction of oxygen in the films during the high temperature annealing.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 577: Symposium H – Advanced Hard and Soft Magnetic Materials , 1999 , 605
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Matsuoka, M., Hoshi, Y., Naoe, M. and Yamanada, S. Y., IEEE Trans. Magn., MAG-18, 1119(1982)Google Scholar
2 Hoshi, Y., Kubota, Y., IEEE Trans. Magn., 31, 2782 (1995)Google Scholar
3 Hoshi, y., Kubota, Y., J. Appl. Phys., 81, 4667 (1997)Google Scholar
4 Sui, X., Kryder, M. H., Wong, B. Y., and Laughlin, D. E., IEEE Trans. Magn., 29, 3751 (1993).Google Scholar
5 Hiratsuka, N., Niizuma, E., Kakizaki, K., J. Magn. Soc. Jpn, 21, 77 (1997)Google Scholar
6 Chen, y. J., Laughlin, D. E., Ma, X., Kryder, M. H., J. Appl. Phys., 81, 4380 (1997)Google Scholar
7 Zhuang, Z., Rao, Maithri, Laughlin, David, Kryder, Mark, submitted to the 43rd annual conference on magnetism & magnetic materials, 1998.Google Scholar
8 Smit, J., Wijn, H.P.J., Ferrites; physical properties of ferrimagnetic oxides in relation to their technical applications, New York, Wiley, 1959.Google Scholar