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Dual-probe scanning tunneling microscope and a carbon nanotube ring transistor

Published online by Cambridge University Press:  11 February 2011

Taishi Shigematsu ,
Hiroyuki Watanabe ,
Chikara Manabe ,
Kei Shimotani  and
Masaaki Shimizu
Taishi Shigematsu
Affiliation:
Ecology Research Laboratory, Corporate Research Laboratory, Fuji Xerox Co., Ltd. 1600, Takematsu, Minamiashigara-shi, Kanagawa-ken, 250–0111, JAPAN
Hiroyuki Watanabe
Affiliation:
Ecology Research Laboratory, Corporate Research Laboratory, Fuji Xerox Co., Ltd. 1600, Takematsu, Minamiashigara-shi, Kanagawa-ken, 250–0111, JAPAN
Chikara Manabe
Affiliation:
Ecology Research Laboratory, Corporate Research Laboratory, Fuji Xerox Co., Ltd. 1600, Takematsu, Minamiashigara-shi, Kanagawa-ken, 250–0111, JAPAN
Kei Shimotani
Affiliation:
Ecology Research Laboratory, Corporate Research Laboratory, Fuji Xerox Co., Ltd. 1600, Takematsu, Minamiashigara-shi, Kanagawa-ken, 250–0111, JAPAN
Masaaki Shimizu
Affiliation:
Ecology Research Laboratory, Corporate Research Laboratory, Fuji Xerox Co., Ltd. 1600, Takematsu, Minamiashigara-shi, Kanagawa-ken, 250–0111, JAPAN
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Abstract

For measuring molecular device, we developed a dual-probe scanning tunneling microscope (D-STM) composed of two STM systems in which a carbon nanotube (NT) was used for STM tip. Using D-STM, we fabricated a NT ring device. The NT ring device showed a switching behavior with applying gate bias. Furthermore, in STM imaging for various gate biases, we could observe directly hole injection into the NT ring.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 738: Symposium G – Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures , 2002 , G14.2
Copyright
Copyright © Materials Research Society 2003

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References

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