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Effect of dielectric/organic interface properties on the performance of the organic thin film transistors

Published online by Cambridge University Press:  18 January 2013

Ronak Rahimi  and
D. Korakakis
Ronak Rahimi
Affiliation:
Lane Department of Computer Science and Electrical Engineering, West Virginia University, Morgantown, WV 26506
D. Korakakis
Affiliation:
Lane Department of Computer Science and Electrical Engineering, West Virginia University, Morgantown, WV 26506
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Abstract

In order to manufacture organic electronic devices with high performance, more detailed studies of the structure and the morphology of the organic materials as well as the underlying physical charge transport mechanisms are warranted. For instance, high efficiency organic thin film transistors (OTFTs) require materials with high charge carrier mobility [1, 2]. The parameters that determine the charge carrier mobility of the device include the structure of the first organic layer at the organic-dielectric interface as well as the morphology and the structural order of the other organic layers. Therefore, fundamental questions about structural properties of organic materials should be answered in order to optimize device performance [2-4].

In this work, several bilayer structures of LiF/PTCDI-C8 and LiF/pentacene were prepared and their morphology and molecular structure were characterized using X-ray reflectivity (XRR) technique. In order to study the effects of the films’ structures and dielectric/organic interfacial properties on the device performance, OTFTs based on these bilayers were fabricated and characterized. It has been observed that PTCDI-C8 thin films have higher molecular packing in the LiF/PTCDI-C8 bilayer structure, which results in superior electrical characteristics for OTFTs based on this organic material. Devices with LiF/PTCDI-C8 bilayer exhibit about one order of magnitude higher output current (Ids) at a constant drain-source voltage (Vds) compared to the devices with LiF/pentacene bilayer. The observed differences in the electrical characteristics of these devices can be attributed to the effects of the dielectric/organic interface and the molecular structure of the organic layers.

Keywords

x-ray reflectivityorganicthin film
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1501: Symposium P – Single-Crystalline Organic and Polymer Semiconductors—Fundamentals and Devices , 2013 , mrsf12-1501-p09-62
Copyright
Copyright © Materials Research Society 2013

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References

REFERENCES

Meruvia, M.S., Hümmelgen, I. A., Adv. Func. Mater. 16, 459 (2006).CrossRefGoogle Scholar
Liu, S., Wang, W. M., Briseno, A. L., Mannsfeld, S. C. B., and Bao, Z., Adv. Mater. 21, 1217 (2009).CrossRefGoogle Scholar
Gershenson, M. E. and Podzorov, V., A. F. Morpurgo, Rev. Mod. Phys. 78, 973 (2006).CrossRefGoogle Scholar
Dimitrakopoulos, C. D., Mascaro, D. J., IBM J. Res. & Dev. 45, 11 (2001).CrossRefGoogle Scholar
Opitz, A., Wagner, J., Brutting, W., Salzmann, I., Koch, N., Manara, J., Pflaum, J., Hinderhofer, A., Schreiber, F., IEEE Journal of Selected Topics in Quantum Electronics, 16, (2010).CrossRefGoogle Scholar
Rost, C., Karg, S., Riess, W., Loi, M. A., Murgia, M., and Muccini, M., Appl. Phys. Lett, 85, 1613–15 (2004).CrossRefGoogle Scholar
Zaumseil, Jana and Sirringhaus, Henning, Chemical Reviews, 107 (2007).CrossRefGoogle Scholar
Hamilton, M.C. and Kanicki, J., IEEE Journal of Selected Topics in Quantum Electronics, 10, 840–8 (2004).CrossRefGoogle Scholar
Tanabe, Y., Macro-molecular Science and Engineering, New Aspects, Springer: New York, U.S., 319 (1999).Google Scholar
Moliton, André, Hiorns, Roger C., Polymer International, 53, 1397–1412 (2004).CrossRefGoogle Scholar
Heutz, S., Sullivan, P., Sanderson, B.M., Schultes, S.M., Jones, T.S., Solar Energy Materials and Solar Cells, 83, 229–245 (2004).CrossRefGoogle Scholar
Holy, Vaclav, Baumbach, T., Pietsch, U., High-Resolution X-ray scattering from thin films and multilayers, Springer, (1999).Google Scholar
Warren, B. E., X-ray diffraction, Courier Dover Publications, (1990).Google Scholar
Parratt, L. G., Physical Review, 95, 2 (1954).CrossRefGoogle Scholar
Als-Nielsen, Jens and McMorrow, Des, Elements of Modern X-ray Physics, New York: Wiley, (1992).Google Scholar
Rahimi, R. and Korakakis, D., Journal of Applied Physics, v. 110, n 1, p 013702 (2011).CrossRefGoogle Scholar
Chua, Lay-Lay, Zaumsell, J., Jul-Fen, C., Ou, E.C.W., Ho, P.K.H., Sirringhaus, H., and Friend, R.H., Nature 434, 194–9 (2005).CrossRefGoogle Scholar
Letizia, J.A., Rivnay, J., Facchetti, A., Ratner, R., Mark, A., and Marks, T.J., Adv. Func. Mater. 20, 50 (2010).CrossRefGoogle Scholar
Xu, Z., Li, S.-h., Ma, L., Li, G., Yang, G., and Yang, Y., Appl. Phys. Lett. 93, 23302 (2008).CrossRefGoogle Scholar
Mills, T., Kaake, L.G., and Zhu, X.-Y., Appl. Phys. A: Mat. Sci.. and Proc. 95, 291 (2009).CrossRefGoogle Scholar
Stenger, I., Frigout, A., Tondelier, D., Geffroy, B., Ossikovski, R., Bonnassieux, Y., Appl. Phys. Lett. 94, 133301 (2009).CrossRefGoogle Scholar
Cheng, Horng-Long, Liang, Xin-Wei, Chou, Wei-Yang, Mai, Yu-Shen, Yang, Chou-Yu, Chang, Li-Ren, Tang, Fu-Ching, Org. Electron. 10 289 (2009).CrossRefGoogle Scholar
Kaake, L.G., Zou, Y., Panzer, M.J., Frisbie, C.D., Zhu, X.-Y., J. Am. Chem. Soc. 129 7824 (2007).CrossRefGoogle Scholar