Hostname: page-component-cd9895bd7-dk4vv Total loading time: 0 Render date: 2024-12-29T03:51:51.406Z Has data issue: false hasContentIssue false
  • English
  • Français

Electroless Deposition and Patterning of Morphologically Complex Precious Metal Films on Semiconductor Surfaces

Published online by Cambridge University Press:  11 February 2011

Lon A. Porter Jr ,
Hee Cheul Choi ,
Alexander E. Ribbe  and
Jillian M. Buriak
Lon A. Porter Jr
Affiliation:
Department of Chemistry, 1393 Brown Laboratories, Purdue University, West Lafayette, IN 47907–1393, U.S.A.
Hee Cheul Choi
Affiliation:
Department of Chemistry, 1393 Brown Laboratories, Purdue University, West Lafayette, IN 47907–1393, U.S.A.
Alexander E. Ribbe
Affiliation:
Department of Chemistry, 1393 Brown Laboratories, Purdue University, West Lafayette, IN 47907–1393, U.S.A.
Jillian M. Buriak
Affiliation:
Department of Chemistry, 1393 Brown Laboratories, Purdue University, West Lafayette, IN 47907–1393, U.S.A.
Get access

Abstract

Precious metals are choice materials for a myriad of applications due their high electrical conductivity, resistance to corrosion, and ligand binding specificity. Indispensable in modern electronics fabrication, precious metals also enjoy widespread use as catalysts, support substrates, and sensor elements. Recent progress towards metallization on diminishing size regimes has imposed increasingly stringent demands upon thin film preparation methodologies. Metallization techniques employed in ultra large scale integration (ULSI) device fabrication, nanoelectromechanical systems (NEMS), and arrayed nanosensors will require unparalleled control of surface morphology, deposition rate, and substrate adhesion without sacrificing throughput or cost effectiveness. Furthermore, precious metal films of this type are essential for fundamental investigations aimed at elucidating the intricate nature of interfacial topics ranging from self-assembled monolayers (SAMs) to heterogeneous catalysis. In contrast to complex and expensive vacuum methods of metallization, research in our laboratory has focused on the preparation of precious metal thin films on semiconductor substrates via electroless deposition. Thin and thick films of gold, platinum, and palladium nanoparticles have been prepared as a result of the immersion of germanium and gallium arsenide substrates into dilute, aqueous solutions of tetrachloraurate (III), tetrachloroplatinate (II), and tetrachloropalladate (II), respectively. This methodology yields nanostructured precious metal films with control over surface morphology and deposition rate. Moreover, metal films prepared in this manner exhibit excellent adhesion to the underlying semiconductor substrate. The resultant films were characterized utilizing scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), and scanning probe microscopy (SPM). This method provides for the facile interfacing of metal nanostructures with group (IV) and III-IV compound semiconductor surfaces.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 737 , 2002 , F4.7
Copyright
Copyright © Materials Research Society 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Mallory, G. O., and Hajdu, J. B., Electroless Plating: Fundamentals and Applications, (AESF, 1990).Google Scholar
Murarka, S. P., Metallization, (Butterworth-Heine, 1993).Google Scholar
3. Porter, L. A. Jr, Choi, H. C., Ribbe, A. E., and Buriak, J. M., Nano Lett. 2, 1067 (2002).Google Scholar
4. Magagnin, L., Maboudian, R., and Carraro, C., J. Phys. Chem. B 106, 401 (2002).Google Scholar
5. Porter, L. A. Jr, Choi, H. C., Schmeltzer, J. M., Ribbe, A. E., Elliott, L. C. C., and Buriak, J. M., Nano Lett. 2, 1369 (2002).Google Scholar
6. Handbook of X-Ray Photoelectron Spectroscopy; ed. Muilenberg, G. E., (Perkin-Elmer Corporation, 1985).Google Scholar
7. Hilbert, D., and Chon-Vossen, S., Geometry and the Imagination, (Chelsea, 1999).Google Scholar
8. Oskam, G., Long, J. G., Natarajan, A., and Searson, P. C., J. Phys. D. 31, 1927 (1998).Google Scholar
9. Boistelle, R., and Astier, J. P., J. Cryst. Growth 90, 14 (1988).Google Scholar
10. Porter, L. A. Jr, Ji, D., Westcott, S. L., Graupe, M., Czernuszewicz, R. S., Halas, N. J., and Lee, T. R., Langmuir 14, 7378 (1998).Google Scholar