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Electronic and Mechanical Properties of DC Sputtered Compositionally Modulated Metal Films

Published online by Cambridge University Press:  25 February 2011

J. S. Drewery  and
A. L. Greer
J. S. Drewery
Affiliation:
University of Cambridge, Department of Materials Science and Metallurgy, Pembroke Street, Cambridge CB2 3QZ, United Kingdom.
A. L. Greer
Affiliation:
University of Cambridge, Department of Materials Science and Metallurgy, Pembroke Street, Cambridge CB2 3QZ, United Kingdom.
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Abstract

We describe a recently constructed apparatus for the measurement of the Young's modulus and Poisson's ratio of free-standing sputtered multilayer films. In comparison with more conventional methods, this is expected to permit both measurement with lower uncertainties and interpretation which is more straightforward. A separate apparatus for the accurate measurement of the conductivity, magnetoresistance, and Hall coefficient of such systems has been prepared which will enable the contribution of Fermi surface-Brillouin zone interactions to the behaviour of these materials to be assessed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 103 , 1987 , 235
Copyright
Copyright © Materials Research Society 1988

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References

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