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Enhancement in Ferroelectricity in V-Doped ZnO Thin Film Grown using Laser Ablation

Published online by Cambridge University Press:  31 January 2011

Tara Dhakal ,
Devajyoti Mukherjee ,
Robert H Hyde ,
Hariharan Srikanth ,
Pritish Mukherjee  and
Sarath Witanachchi
Tara Dhakal
Affiliation:
tdhakal@cas.usf.edu, University of South Florida, Physics, Tampa, Florida, United States
Devajyoti Mukherjee
Affiliation:
dmukherj@mail.usf.edudevajyotim@gmail.com, University of South Florida, Physics, Tampa, Florida, United States
Robert H Hyde
Affiliation:
rhhyde@mail.usf.edu, United States
Hariharan Srikanth
Affiliation:
sharihar@cas.usf.edu, University of South Florida, Physics, Tampa, Florida, United States
Pritish Mukherjee
Affiliation:
pritish@cas.usf.edu, University of South Florida, Physics, Tampa, Florida, United States
Sarath Witanachchi
Affiliation:
switanac@cas.usf.edu, University of South Florida, Physics, Tampa, Florida, United States
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Abstract

We report evidence of enhancement in ferroelectricity in thin films of vanadium (V) doped ZnO grown at higher oxygen pressure. This process reduces oxygen deficiency and the material becomes very insulating, which in turn lowers the leakage current through the ferroelectric capacitor. 2 at. % V doped ZnO films, with thickness of approximately 1 μm were grown epitaxially on c-cut sapphire (Al2O3) (0001) at a growth temperature of 600°C. X-ray analysis showed the layers to be epitaxial where the (0002) diffraction peak had a rocking curve FWHM below 1°. The films with higher oxygen pressure were more insulating than the one grown with lower oxygen pressure. The saturation polarization doubled when the growth pressure increased from 300 mT to 500 mT. Time gated ICCD imaging of the ablated plasma during various O2 pressures and how it translated to the film quality are presented.

Keywords

ferroelectricitylaser ablationthin film
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1199: Symposium F –Multiferroic and Ferroelectric Materials , 2009 , 1199-F03-44
Copyright
Copyright © Materials Research Society 2010

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