Hostname: page-component-cd9895bd7-gbm5v Total loading time: 0 Render date: 2025-01-02T19:54:49.574Z Has data issue: false hasContentIssue false
  • English
  • Français

Fabrication OF ZnO and ZnMgO Thin Films and UV Photodetectors by Mist Chemical Vapor Deposition Method

Published online by Cambridge University Press:  01 February 2011

Toshiyuki Kawaharamura ,
Toshiyuki Kawaharamura ,
Hiroyuki Nishinaka  and
Shizuo Fujita
Toshiyuki Kawaharamura
Affiliation:
tosiyuki@iic.kyoto-u.ac.jp, Kyoto University, Dept. Electronic Science and Engineering, Katsura, Nishigyo-ku, Kyoto, 615-8520, Japan
Toshiyuki Kawaharamura
Affiliation:
tosiyuki@iic.kyoto-u.ac.jp, Kyoto University, Dept. Electronic Science and Engineering, Katsura, Kyoto, 615-8520, Japan
Hiroyuki Nishinaka
Affiliation:
nisinaka@iic.kyoto-u.ac.jp, Kyoto University, Dept. Electronic Science and Engineering, Katsura, Kyoto, 615-8520, Japan
Shizuo Fujita
Affiliation:
fujita@iic.kyoto-u.ac.jp, Kyoto University, International Innovation Center, Katsura, Kyoto, 615-8520, Japan
Get access

Abstract

Deposition of Zn1-xMgxO thin films on glass substrates has been investigated by the simple and cost-effective mist CVD technique. A water solution of zinc acetate and magnesium acetate was used as the source of Zn and Mg. The solution was ultrasonically atomized, and the aerosols hence formed were supplied by the N2 carrier gas to the substrates. The band gap energy of ZnMgO was successfully controlled from 3.25 eV (ZnO) to 3.75 eV with the concentration ratio [Mg]/([Zn]+[Mg]) in the solution. The transparency in the visible region was higher than 90% and the surface RMS roughness was 7.5 nm (an example for ZnO) despite the polycrystalline structure; they are satisfactory for the optical applications. A UV photodetctor with interdigital electrode structure on the ZnMgO surface was fabricated, where the photoresponsivity of 2.6 A/W at 350 nm and the lowest detectable power of about 1 μW were obtained. Although these values are satisfactory for the simple UV detection but the existence of deep defects is deteriorating the dynamic response of the detector device.

Keywords

spray pyrolysisoxidephotoconductivity
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 957: Symposium K – Zinc Oxide and Related Materials , 2006 , 0957-K07-27
Copyright
Copyright © Materials Research Society 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Kawaharamura, T., Nishinaka, H., Kametani, K., Masuda, Y., Tanigaki, M., and Fujita, S., J. Soc. Mater. Sci. Jpn. 55, 153 (2006) [in Japanese].Google Scholar
2. Kamada, Y., Kawaharamura, T., Nishinaka, H., and Fujita, S., Jpn. J. Appl. Phys. 45, L857 (2006).Google Scholar
3. Major, S., Banerjee, A., and Chopra, K. L., Thin Solid Films 108, 333 (1983).Google Scholar
4. Aktaruzzaman, A. F., Sharma, G. L., and Malhotra, L. K., Thin Solid Films 198, 67 (1991).Google Scholar
5. Reddya, K. T. Ramakrishna, Gopalaswamya, H., Reddya, P. J., and Miles, R. W., J. Cryst. Growth 210, 516 (2000).Google Scholar
6. Lokhande, B. J., Patil, P. S., and Uplane, M. D., Physica B 302–303, 59 (2001).Google Scholar
7. Olvera, M. D. L., Maldonado, A., Asomoza, R., Solorza, O., and Acosta, D. R., Thin Solid Films 394, 242 (2001).Google Scholar
8. Lee, Y., Kim, H., and Roh, Y., Jpn. J. Appl. Phys. 40, 2423 (2001).Google Scholar
9. Blandenet, G., Court, M., and Lagarde, Y., Thin Solid Fims 77, 81 (1981).Google Scholar