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First Applications of Electron Energy-Loss Spectroscopy with High Energy Resolution

Published online by Cambridge University Press:  11 February 2011

Gerald Kothleitner ,
Christoph Mitterbauer ,
Werner Grogger ,
Henny Zandbergen ,
Peter Tiemeijer ,
Bert Freitag ,
Melanie Barfels  and
Ferdinand Hofer
Gerald Kothleitner
Affiliation:
Research Institute for Electron Microscopy, Graz University of Technology, Graz, A-8010, Austria
Christoph Mitterbauer
Affiliation:
Research Institute for Electron Microscopy, Graz University of Technology, Graz, A-8010, Austria
Werner Grogger
Affiliation:
Research Institute for Electron Microscopy, Graz University of Technology, Graz, A-8010, Austria
Henny Zandbergen
Affiliation:
Laboratory of Materials Science, Centre for HREM, Delft University of Technology, Delft, 2628 AL, The Netherlands
Peter Tiemeijer
Affiliation:
FEI Electron Optics, PO Box 80066, 5600 KA Eindhoven, The Netherlands
Bert Freitag
Affiliation:
FEI Electron Optics, PO Box 80066, 5600 KA Eindhoven, The Netherlands
Melanie Barfels
Affiliation:
Gatan Inc. Pleasanton CA 94588, USA
Ferdinand Hofer
Affiliation:
Research Institute for Electron Microscopy, Graz University of Technology, Graz, A-8010, Austria
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Abstract

A new transmission electron microscope equipped with a monochromator and a high resolution energy-filter was used for the first time to fully exploit the chemical bonding information contained in the near edge fine structures (ELNES) of electron energy-loss spectra. The instrument is capable of acquiring spectra with an energy resolution in the range of 0.1 eV, thus opening up the way for improved ELNES information. ELNES spectra of TiO2 and CoO have been recorded and are compared with data obtained with a conventional microscope and with x-ray absorption spectroscopy. In case of the L2,3 edges of the transition metals the new instrument revealed previously unobservable fine structure details, but for the O K edges the improved energy resolution does not result in more detailed structural features than observable in common microscopes. Furthermore, the potential of the new microscope to obtain chemical bonding information at the nanometer scale is discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 738: Symposium G – Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures , 2002 , G1.7
Copyright
Copyright © Materials Research Society 2003

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References

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