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Published online by Cambridge University Press: 26 February 2011
Planar defects produced in L10-ordered FePd during annealing after cold-deformation in the disordered cubic state have been characterized by transmission electron microscopy (TEM). The defects evolving during annealing include arrays of overlapping stacking faults (SF's), {111}-conjugated microtwins (μT's) and thermal antiphase boundaries (APB's). The defect formation mechanisms proposed here are similar to twinning mechanism reported for FCC-metals during annealing. Thus, SF arrays and faulted μT's in the L10-ordered FePd appear to form during the early stages of annealing by atomic attachment faulting on {111}-facets of the transformation interfaces. During later stages of annealing the reduced amount and the change in nature of the driving forces for the microstructural rearrangement result in changes in the predominant defect formation mechanism. The features of the defect genesis in L10-FePd are discussed with respect to solid-state transformations during processing of these ferromagnetic intermetallics.