Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-10T11:29:35.315Z Has data issue: false hasContentIssue false
  • English
  • Français

Magnetic Domain Imaging with a Photoemission Microscope

Published online by Cambridge University Press:  15 February 2011

C.M. Schneider ,
R. Frömter ,
C. Ziethen ,
W. Swiech ,
N.B. Brookes ,
G. Schönhense  and
J. Kirschner
C.M. Schneider
Affiliation:
Inst. f. Physik, Joh. Gutenberg-Universität, Staudingerweg 7, D-S5099 Mainz, Germany
R. Frömter
Affiliation:
Max-Planck-Institutf. Mikrostrukturphysik, Weinberg 2, D-06120 Halle, Germany
C. Ziethen
Affiliation:
Inst. f. Physik, Joh. Gutenberg-Universität, Staudingerweg 7, D-S5099 Mainz, Germany
W. Swiech
Affiliation:
F. Seitz Materials Research Lab., University of Illinois at Urbana-Champaign, IL 61801, USA
N.B. Brookes
Affiliation:
European Synchrotron Radiation Facility, RP220, F-38043 Grenoble, France
G. Schönhense
Affiliation:
Inst. f. Physik, Joh. Gutenberg-Universität, Staudingerweg 7, D-S5099 Mainz, Germany
J. Kirschner
Affiliation:
Max-Planck-Institutf. Mikrostrukturphysik, Weinberg 2, D-06120 Halle, Germany
Get access

Abstract

Photoelectron emission microscopy (PEEM) has proven to be a versatile analytical technique in surface science. When operated with circularly polarized light in the soft x-ray regime, however, photoemission microscopy offers a unique combination of magnetic and chemical information. Exploiting the high brilliance and circular polarization available at a helical undulator beamline, the lateral resolution in the imaging of magnetic domain structures may be pushed well into the sub-micrometer range. Using a newly designed photoemission microscope we show that under these circumstances not only domains, but also domain walls can be selectively investigated. The high sensitivity of the technique yields a sizable magnetic contrast even from magnetic films as thin as a fraction of a single monolayer. The combination of chemical selectivity and information depth is successfully employed to investigate the magnetic behavior of buried layers and covered surfaces. This approach offers a convenient access to magnetic coupling phenomena in magnetic sandwiches.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 475: Symposium M – Magnetic Ultrathin Films, Multilayers, and Surfaces – 1997 , 1997 , 381
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Kranz, J. and Hubert, A., Z. Angew. Phys. 15, 220 (1963)Google Scholar
[2] Schmidt, F., Rave, W., and Hubert, A., IEEE Trans. Magnetics 21, 1596 (1985)Google Scholar
[3] Fuchs, E., Naturwiss. 47, 392 (1960)Google Scholar
[4] Chapman, J.N., J. Phys. D 17, 623 (1984)Google Scholar
[5] Koike, R. and Hayakawa, K., Jpn. J. Appl. Phys. 23, L187 (1984)Google Scholar
[6] Oepen, H.P. and Kirschner, J., Scanning Microscopy 5, 1 (1991)Google Scholar
[7] Scheinfein, M.R., Unguris, J., Kelley, M.H., Pierce, D.T., and Celotta, R.J., Rev. Sci. Instrum. 61, 2501 (1990)Google Scholar
[8] Martin, Y. and Wickramasinghe, M.H., Phys. Rev. Lett. 50, 1455 (1987)Google Scholar
[9] Wadas, A., Rice, P., and Moreland, J., App. Phys. A 59, 63 (1994)Google Scholar
[10] Hehn, M., Ounadjela, K., Bucher, J.P., Rousseaux, F., Decanini, D., Bartenlian, B., and Chappert, C., Science 272, 1782 (1996)Google Scholar
[11] Prins, M.W.J., Groeneveld, R.H.M., Abraham, D.L., van Kempen, H., and van Kesteren, H.W., Appl. Phys. Lett. 66, 1141 (1995)Google Scholar
[12] Fischer, P., Schuetz, G., Schmahl, G., Guttmann, P., and Raasch, D., Z. Phys. B: Condens. Matt. 101, 313 (1996)Google Scholar
[13] Altman, M.S., Pinkvos, H., Hurst, J., Poppa, H., Marx, G., and Bauer, E., Mat. Res. Soc. Symp. Proc. 232, 125 (1991)Google Scholar
[14] Stöhr, J., Wu, Y., Samant, M.G., Hermsmeier, B.D., Harp, G., Koranda, S., Dunham, D., and Tonner, B.P., Science 259, 658 (1993)Google Scholar
[15] Schneider, C.M., Holldack, K., Kinzler, M., Grunze, M., Oepen, H.P., Schäfers, F., Petersen, H., Meinel, K., and Kirschner, J., Appl. Phys. Lett. 65, 2432 (1993)Google Scholar
[16] Hillebrecht, F.U., Kinoshita, T., Spanke, D., Dresselhaus, J., Roth, C., Rose, H.B., and Kisker, E., Phys. Rev. Lett. 75, 2224 (1995)Google Scholar
[17] Marx, G.K.L., Przychowski, M.D.v., Schönhense, G., Henk, J., Feder, R., and Schneider, C.M., submitted to Physical Review Letters (1997)Google Scholar
[18] Spivak, G.V., Dombrovskaia, T.N., and Sedov, N.N., Sov. Phys. Dokl. 2, 120 (1957)Google Scholar
[19] Mundschau, M., Romanowicz, J., Wang, J.Y., Sun, D.L., and Chen, H.C, J. Vac. Sci. Technol. B 14, 3126 (1996)Google Scholar
[20] Petersen, H., Jung, K., Hellwig, C., Peatman, W.B., and Gudat, W., Rev. Sci. Instrum. 66, 1 (1995)Google Scholar
[21] Elleaume, P., J. Synchrotron Rad. I, 19 (1994)Google Scholar
[22] Chen, C.T., Rev. Sci. Instrum. 65, 1229 (1992)Google Scholar
[23] Tonner, B.P., Harp, G.R., Roranda, S.F., and Zhang, J., Rev. Sci. Instrum. 63, 564 (1992)Google Scholar
[24] Schütz, G., Wagner, W., Wilhelm, W., Kienle, P., Zeller, R., Frahm, R., and Materlik, G., Phys. Rev. Lett. 58, 737 (1987)Google Scholar
[25] Chen, C.T., Sette, F., Ma, Y., and Modesti, S., Phys. Rev. B 42, 7262 (1990)Google Scholar
[26] Swiech, W., Fecher, G.H., Ziethen, C., Schmidt, O., Schönhense, G., Grzelakowski, R., Schneider, C.M., Frömter, R., and Rirschner, J., J. Electron Spectr. and Rel. Phen., (accepted) (1996)Google Scholar
[27] Chrobok, G., Hofmann, M., Regenfus, G., and Sizmann, R., Phys. Rev. B 15, 429 (1977)Google Scholar
[28] Abraham, D.L. and Hopster, H., Phys. Rev. Lett. 58, 1352 (1987)Google Scholar
[29] Seah, M.P. and Dench, W.A., Surf. Interf. Anal. 1, 1 (1979)Google Scholar
[30] Schneider, C.M., Meinel, R., Rirschner, J., Neuber, M., Wilde, C, Grunze, M., Holldack, R., Celinski, Z., and Baudelet, F., J. Magn. Magn. Mater. 162, 7 (1996)Google Scholar
[31] Venus, D. and Heinrich, B., Phys. Rev. B 53, R1733 (1996)Google Scholar
[32] Stoeffler, D. and Gauthier, F., J. Magn. Magn. Mater. 147, 260 (1995)Google Scholar
[33] Stoeffler, D. and Gauthier, F., Phys. Rev. B 44, 10389 (1991)Google Scholar
[34] Chikazumi, S., Physics of Magnetism. (Wiley & Sons, Rrieger Publishing Company, Malabor, Florida, New York, 1964)Google Scholar
[35] DeBlois, R.W. and Graham, J.C.D., J. Appl. Phys. 29, 931 (1958)Google Scholar
[36] Oepen, H.P. and Rirschner, J., Phys. Rev. Lett. 62, 819 (1989)Google Scholar