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Magnetic properties of Mn-doped GaN, InGaN, and AlGaN

Published online by Cambridge University Press:  01 February 2011

M. L. Reed
Affiliation:
Department of Electrical and Computer Engineering, North Carolina State University Raleigh, NC 27695–7911
E. A. Berkman
Affiliation:
Department of Materials Science and Engineering, North Carolina State University Raleigh, NC 27695–7911
M. J. Reed
Affiliation:
Department of Materials Science and Engineering, North Carolina State University Raleigh, NC 27695–7911
F. E. Arkun
Affiliation:
Department of Materials Science and Engineering, North Carolina State University Raleigh, NC 27695–7911
T. Chikyow
Affiliation:
National Institute for Material Science (NIMS), Nanomaterial Research laboratories, Nano-assembly R.G 1–2–1 Sengen Tsukuba Ibaraki 305–0047, Japan
S. M. Bedair
Affiliation:
Department of Electrical and Computer Engineering, North Carolina State University Raleigh, NC 27695–7911
J. M. Zavada
Affiliation:
U.S. Army Research Office, Research Triangle Park, North Carolina 27709
N. A. El-Masry
Affiliation:
Department of Materials Science and Engineering, North Carolina State University Raleigh, NC 27695–7911
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Abstract

We report on the growth and magnetic properties of single crystal Mn-doped GaN, InGaN, and AlGaN films. The III-Nitride films were grown by MOCVD, while the Mn doping was performed by solid-state diffusion of a surface Mn layer deposited by pulsed laser ablation. Mn-doped InxGa1-xN films were grown with x < 0.15, where the easy axis of magnetization rotates from in-plane to out-of-plane by changing the InxGa1-xN thickness/strain-state of the film from compressively strained to relaxed. Mn-doped AlxGa1-xN films were grown with x < 0.40 showing ferromagnetic behavior above room temperature. SQUID measurements ruled out superparamagnetism within these films. By optimizing the growth and annealing conditions of Mn-doped III-Nitrides, we have achieved Curie temperatures in the range of 228 to 500K. These ferromagnetic Mn-doped III-Nitride films exhibit hysteresis with a coercivity of 100–500 Oe. TEM analysis showed no secondary phases within these films.

Type
Research Article
Copyright
Copyright © Materials Research Society 2004

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References

REFERENCES

1. Dietl, T., Sawicki, M., Khoi, L. v., Jaroszynski, J., Kossacki, P., Cibert, J., Ferrand, D., Tatarenko, S., and Wasiela, A., Physica Status Solidi B-Basic Research 229, 665672 (2002).Google Scholar
2. Fiederling, R., Keim, M., Reuscher, G., Ossau, W., Schmidt, G., Waag, A., and Molenkamp, L. W., Nature 402, 787790 (1999).Google Scholar
3. Ohno, H., Shen, A., Matsukura, F., Oiwa, A., Endo, A., Katsumoto, S., and Iye, Y., Applied Physics Letters 69, 363365 (1996).Google Scholar
4. Reed, M. L., El-Masry, N. A., Stadelmaier, H. H., Ritums, M. K., Reed, M. J., Parker, C. A., Roberts, J. C., and Bedair, S. M., Applied Physics Letters 79, 34733475 (2001).Google Scholar
5. Overberg, M. E., Abernathy, C. R., Pearton, S. J., Theodoropoulou, N. A., McCarthy, K. T., and Hebard, A. F., Applied Physics Letters 79, 13121314 (2001).Google Scholar
6. Reed, M. J., El-Masry, N. A., Parker, C. A., Roberts, J. C., and Bedair, S. M., APL 77, 41214123 (2000).Google Scholar
7. Parker, C. A., Roberts, J. C., Bedair, S. M., Reed, M. J., Liu, S. X., and El-Masry, N. A., Applied Physics Letters 75, 27762778 (1999).Google Scholar
8. Matsukura, F., Ohno, H., Shen, A., and Sugawara, Y., Phys. Rev. B., 57, R2037 (1998).Google Scholar
9. Jahnen, B., Albrecht, M., Dorsch, W., Strunk, H., Hanson, D. and Davis, R., MRS Internet Journal, Nitride Semiconductor Research 3, 39 (1998).Google Scholar
10. Weber, Z., Beranamara, M., Washburn, J., Donnaga, J., Bak-Misiuk, J., Piner, E., Roberts, J. and Bedair, S.M., J. of Electronic Matls., 439, 4 (2001).Google Scholar