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Modeling of Advanced Light Trapping Approaches in Thin-Film Silicon Solar Cells

Published online by Cambridge University Press:  28 June 2011

Miro Zeman ,
Olindo Isabella ,
Klaus Jäger ,
Pavel Babal ,
Serge Solntsev  and
Rudi Santbergen
Miro Zeman
Affiliation:
Delft University of Technology, PVMD/DIMES, P.O. Box 5053, 2628 CD Delft, Netherlands
Olindo Isabella
Affiliation:
Delft University of Technology, PVMD/DIMES, P.O. Box 5053, 2628 CD Delft, Netherlands
Klaus Jäger
Affiliation:
Delft University of Technology, PVMD/DIMES, P.O. Box 5053, 2628 CD Delft, Netherlands
Pavel Babal
Affiliation:
Delft University of Technology, PVMD/DIMES, P.O. Box 5053, 2628 CD Delft, Netherlands
Serge Solntsev
Affiliation:
Delft University of Technology, PVMD/DIMES, P.O. Box 5053, 2628 CD Delft, Netherlands
Rudi Santbergen
Affiliation:
Delft University of Technology, PVMD/DIMES, P.O. Box 5053, 2628 CD Delft, Netherlands
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Abstract

Due to the increasing complexity of thin-film silicon solar cells, the role of computer modeling for analyzing and designing these devices becomes increasingly important. The ASA program was used to study two of these advanced devices. The simulations of an amorphous silicon solar cell with silver nanoparticles embedded in a zinc oxide back reflector demonstrated the negative effect of the parasitic absorption in the particles. When using optical properties of perfectly spherical particles a modest enhancement in the external quantum efficiency was found. The simulations of a tandem micromorph solar cell, in which a zinc oxide based photonic crystal-like multilayer was incorporated as an intermediate reflector (IR), demonstrated that the IR resulted in an enhanced photocurrent in the top cell and could be used to optimize the current matching of the top and bottom cell.

Keywords

photovoltaicSisimulation
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1321: Symposium A – Amorphous and Polycrystalline Thin-Film Silicon Science and Technology , 2011 , mrss11-1321-a23-05
Copyright
Copyright © Materials Research Society 2011

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References

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