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Nanoimpedance Microscopy and Spectroscopy

Published online by Cambridge University Press:  11 February 2011

Rui Shao ,
Sergei V. Kalinin  and
Dawn A. Bonnell
Rui Shao
Affiliation:
Department of Materials Science and Engineering, University of Pennsylvania, 3231 Walnut St, Philadelphia, PA 19104
Sergei V. Kalinin
Affiliation:
Department of Materials Science and Engineering, University of Pennsylvania, 3231 Walnut St, Philadelphia, PA 19104
Dawn A. Bonnell
Affiliation:
Department of Materials Science and Engineering, University of Pennsylvania, 3231 Walnut St, Philadelphia, PA 19104
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Abstract

One of the key limiting factors in current-based scanning probe microscopies (SPM) is the quality of tip-sample contact and stray capacitance in the probe-surface junction. We conduct impedance spectroscopy over a broad frequency range (40Hz∼110MHz) through an AFM tip to quantify local electrical properties. Equivalent circuit for the tip-surface contact is constructed based on the impedance data and is used to study the mechanisms of relaxation in the near-tip region. Relative contributions of tip-surface contact and materials properties to the signal are discussed. This technique, referred to as Nanoimpedance Microscopy/Spectroscopy, is demonstrated in the imaging of an electronic ceramic: a ZnO varistor. Analysis of impedance spectra allows separation of tip-surface interactions and grain boundary behavior.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 738: Symposium G – Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures , 2002 , G4.4
Copyright
Copyright © Materials Research Society 2003

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References

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