Hostname: page-component-cd9895bd7-7cvxr Total loading time: 0 Render date: 2025-01-02T18:09:08.441Z Has data issue: false hasContentIssue false
  • English
  • Français

New Compound Semiconductor Materials for Nuclear Detectors

Published online by Cambridge University Press:  21 February 2011

Michael R. Squillante ,
John Zhang ,
Chuxin Zhou ,
Paul Bennett  and
Larry Moy
Michael R. Squillante
Affiliation:
Radiation Monitoring Devices, Inc., 44 hunt Street, Watertown, MA 02172
John Zhang
Affiliation:
Radiation Monitoring Devices, Inc., 44 hunt Street, Watertown, MA 02172
Chuxin Zhou
Affiliation:
Radiation Monitoring Devices, Inc., 44 hunt Street, Watertown, MA 02172
Paul Bennett
Affiliation:
Radiation Monitoring Devices, Inc., 44 hunt Street, Watertown, MA 02172
Larry Moy
Affiliation:
Radiation Monitoring Devices, Inc., 44 hunt Street, Watertown, MA 02172
Get access

Abstract

In many instances, the ability of scientists and engineers to make nuclear radiation measurements is only limited by the properties of available radiation detectors. Because of this, research into new semiconductor materials for radiation detection has been, and continues to be, a very active field. This article reviews recent research on several promising “new” materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 302: Symposium F – Semiconductors for Room-Temperature Radiation Detector Applications , 1993 , 319
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Lund, J.C., Olschner, F., Shah, K.S. and Squillante, M.R., (1992) Presented at SPIE 1992 International Symposium on Optical Applied Science and Engineering, San Diego, CA, July 1992; to be published in Proceedings from SPIE Conference 1734, December 1992.Google Scholar
2 Sakai, E., Nucl. Inst. and Meth., 196, 121 (1982).Google Scholar
3 Armantrout, G.A., Swierkowski, S.P. Sherohman, J. W. and Yee, J.H., IEEE Trans. Nucl. Sci., NS- 24, 121 (1977).Google Scholar
4 Bencivelli, W., Bertolucci, E., and Bottigli, U., Del Guerra, A., Messineo, A., Nelson, W.R., Randaccio, P., Rosso, V., Russo, P., Stefanini, A., Nucl. Inst. and Meth., A 310, 210 (1991).Google Scholar
5 Squillante, M.R., Shah, K.S. and Moy, L., Nucl. Inst. and Meth, A 288, 79 (1990).Google Scholar
6 Lund, J.C., Olschner, F., Sinclair, F. and Squillante, M.R., (1988) Nucl. Inst. and Meth., A272, 885.Google Scholar
7 Avset, B.S., Ellison, J.A., Evensen, L., Hansen, T-E., Roe, S., Wheadon, R., Nucl. Inst. and Meth., A 288, 131 (1990).Google Scholar
8 Gatti, E., Rehak, P. and Walten, J.T., Nucl. Inst. and Meth., 226, 129 (1984).Google Scholar
9 Eberhart, J.E., Ryan, R.D., and Tavendale, A.J., App. Phys. Lett., 17, 427 (1978).CrossRefGoogle Scholar
10 Kobayashi, T., Kura, I., Hojo, A., and Sugita, T., IEEE Trans, Nucl. Sci., NS- 23, 97 (1976).Google Scholar
11 Wang, C.L., Pocha, M.D., Morse, J.D., Singh, M.S., and Davis, B.A., Appl. Phys. Lett. 54, 1451 (1989).Google Scholar
12 Benz, ICW., Irsigler, R., Ludwig, J., Rosenzweig, J., Runge, K., Schafer, F., Schneider, J. and Webel, M., Nucl. Inst. and Methods, A= 493 (1992).Google Scholar
13 Garconnet, J-P., J-L., Bourgade, Nail, M., Schirmann, D. and Cuzin, M., Presented at the APS. 9th Topical Conference on High Temperature Plasma Diagnostics, Santa Fe, NM, March 1992.Google Scholar
14 Bertin, R., D'Auria, S., Del Papa, C., Fiori, F., Lisowski, B., O'Shea, V., Pelfer, P.G., Smith, K., and Zichichi, A., Nucl. Inst. and Meth., A 294, 211 (1990).Google Scholar
15 Raghavan, R.S., Phys. Rev. Lett., 37, 259 (1976).Google Scholar
16 Olschner, F., Lund, J.C., Squillante, M.R. and Kelly, D.L., IEEE Trans. Nucl. Sci., NS 36, 36 (1989).Google Scholar
17 Lund, J.C., Olschner, F., Ahmed, F., and Shah, K.S., in Diamond. Boron Nitride, Silicon Carbide and Related Wide Bandgap Semiconductors, eds. Glass, J.T., Messier, R.F. and Fujimori, N., Proceedings of the MRS, 162 (1990).Google Scholar
18 Ribeiro, C.A., and Pautrat, J.L., Solid State Comm. 13, 589 (1973).Google Scholar
19 Larson, T.L. and Stevenson, D.A., J. Appl. Phys., 44, 843 (1973).Google Scholar
20 Saulnier, K., Squillante, M.R. and Entine, G., Solid State Nuclear Sensor for High Temperature Down Hole Logging, Final Report, DOE Contract No. DE-AC02-83ER80058 (1984).Google Scholar
21 Butler, J.F., Lingren, C. and Doty, F.P., IEEE Trans. Nucl. Sci., NS- 39, 129 (1992).Google Scholar
22 Roth, M., Burger, A., Nissenbaum, J. and Schieber, M., IEEE Trans. Nucl. Sci., NS- 34, 465 (1987).Google Scholar
23 Burger, A. and Roth, M., J. Cryst. Grow., 67, 507 (1984).Google Scholar
24 Burger, A., Roth, M. and Schieber, M., IEEE Trans Nucl Sci., NS- 32, 556 (1985).Google Scholar
25 Lund, J.C., Shah, K.S., Olschner, F., Zhang, J. Moy, L Medrick, S and Squillante, M.R., Nucl. Inst. and Methods, A322, 464 (1992)Google Scholar
26 Hofstadter, R., Nucleonics, April, 2 (1949).Google Scholar
27 Rahman, L.U., Fisher, W.A., Hofstadter, R. and Shen, J., Nucl. Instr. and Meth., A 261, 427 (1987).Google Scholar
28 Olschner, F., Toledo-Quinones, M., Shah, K.S., and Lund, J.C., IEEE Trans. Nucl. Sci., NS- 37, 1162 (1990).Google Scholar
29 Shah, K.S., Olschner, F., Moy, L. and Squillante, M.R., Nucl. Inst. and Meth, A 299, 57 (1990).Google Scholar
30 Olschner, F., Shah, K.S., Lund, J.C., Zhang, J., Daley, K., Medrick, S. and Squillante, M.R., Nucl. Instr. and Meth., A 322, 504 (1992).Google Scholar
31 Shah, K.S., Lund, J.C., Moy, L., Zhang, J., Olschner, F. and Squillante, M.S., Presented at SPIE 1992 International Symposium on Optical Applied Science and Engineering, San Diego, CA, July 1992; to be published in Proceedings from SPIE Conference 1734, December 1992.Google Scholar
32 Squillante, M.R., Zhou, C., Moy, L.P., Zhang, J. and Shah, K., Presented at the 1992 IEEE Nuclear Science Symposium, Orlando, FL, Nov. 1992, submitted for publication in IEEE Trans. Nucl. Sci., NS-40, Aug. 1993 (1993).Google Scholar
33 Markakis, J.M. IEEE Trans. Nucl. Sci., NS- 35, 356 (1988).Google Scholar
34 Shah, K.S. Lund, J.C. Olschner, F. Zhang, J. Moy, L.P., and Squillante, M.R., TIBr1−xIx Photodetectors for Scintillation Spectroscopy, 1991 IEEE Nucl. Sci. Symp. Conference Record, Santa Fe, Nov. 1991.Google Scholar