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Nondestructive Depth Profiling of a Diffuse Interface

Published online by Cambridge University Press:  21 February 2011

Anthony N. Sinclair ,
Phineas Dickstein  and
Michael A. Graf
Anthony N. Sinclair
Affiliation:
University of Toronto, Dept. of Mechanical Engineering, 5 King's College Road, Toronto, Canada M5S-1A4
Phineas Dickstein
Affiliation:
University of Toronto, Dept. of Mechanical Engineering, 5 King's College Road, Toronto, Canada M5S-1A4
Michael A. Graf
Affiliation:
University of Toronto, Dept. of Mechanical Engineering, 5 King's College Road, Toronto, Canada M5S-1A4
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Abstract

A numerical solution of the one-dimensional wave equation is used to find the characteristics of wave propagation in a non-homogeneous medium. The solution is used to determine the magnitude and phase of the reflection coefficient at a diffuse interface. The result is found to be strongly dependent on sonic frequency. Comparison is made between theoretical calculations and measurements of the reflection coefficient at a copper-to-nickel diffusion bond.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 142: Symposium U – Nondestructive Monitoring of Materials Properties , 1988 , 343
Copyright
Copyright © Materials Research Society 1989

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References

1. Brekhovskikh, L.M., Waves in Layered Media, 2nd ed. (Academic Press, New York, 1980), pp. 161–180 and pp. 188–192.Google Scholar
2. Levine, H., Unidirectional Wave Motions, (North-Holland, Amsterdam, 1978), pp. 323–335.Google Scholar
3. Sinclair, A.N. and Graf, M., submitted to Research in Nondestructive Evaluation (1988).Google Scholar
4. Shoup, T.E., Applied Numerical Methods for the Microcomputer, (Prentice Hall, Englewood Cliffs, New Jersey, 1984), pp. 116–119.Google Scholar