Hostname: page-component-cd9895bd7-7cvxr Total loading time: 0 Render date: 2025-01-04T03:51:32.739Z Has data issue: false hasContentIssue false
  • English
  • Français

Optical-Fiber and Entry-Cone Contact Stresses

Published online by Cambridge University Press:  10 February 2011

J. M. Anderson ,
J. F. Malluck ,
M. M. Tabaddo ,
C. K. Sidbury  and
T. E. McNeil
J. M. Anderson
Affiliation:
Bell Labs, Lucent Technologies, 2000 Northeast Expressway, Norcross, GA 30071
J. F. Malluck
Affiliation:
Bell Labs, Lucent Technologies, 2000 Northeast Expressway, Norcross, GA 30071
M. M. Tabaddo
Affiliation:
Bell Labs, Lucent Technologies, 2000 Northeast Expressway, Norcross, GA 30071
C. K. Sidbury
Affiliation:
Bell Labs, Lucent Technologies, 2000 Northeast Expressway, Norcross, GA 30071
T. E. McNeil
Affiliation:
Bell Labs, Lucent Technologies, 2000 Northeast Expressway, Norcross, GA 30071
Get access

Abstract

Many of the broken fibers in optical connectors, especially those that seem to occur over time without apparent provocation are found in the ferrule at the transition from entry cone to alignment capillary. This paper contends that many such breaks are due to local stresses caused by debris or some other relatively rigid imperfection in the transition neighborhood. Stress estimates from beam theory and from a finite-element model are presented along with some indirect experimental observations supporting the contention.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 531: Symposium DD – Reliabilty of Photonics Materials & Structures , 1998 , 223
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Suhir, E., Pan-American Congress of Applied Mechanics (PACAM - Vl), Rio de Janeiro, 1998.Google Scholar
2. Kinney, M., in Failure Prevention and Reliability -1987, ASME DE-19, 1988, pp. 75–79.Google Scholar
3. Anderson, J. M., Hardee, A. G., King, W. W., LeFevre, B. G., in Proc. ASM Int'l. 4th Electronic Mat'ls and Processing Congress, 1991, pp. 225–228.Google Scholar
4. LeFevre, B. G., King, W. W., Hardee, A. G., Carlisle, A. W., Bradley, K. B., J. of Lightwave Tech., 11,537 (1993).Google Scholar
5. King, W. W., J of Electronic Packaging, 115, 39 (1993).Google Scholar
6. Holman, J. R., Jenkins, A. C., Subh, N.T., Travieso, R., in Int'l Wire & Cable Symp. Proceedings, 1994, pp. 795–801.Google Scholar
7. King, W. W., LeFevre, B. G., Stephenson, D. L., in Int'l Wire & Cable Symp. Proceedings, 1996, pp. 228–235.Google Scholar
8. Timoshenko, S. P. and Goodier, J.N., Theory of Elasticity, 3rd ed. (McGraw-Hill Book Company, New York, 1970), pp. 358–359.Google Scholar
9. ANSYS Version 5.3, ANSYS, Inc., Houston, PA, 1996.Google Scholar