Hostname: page-component-745bb68f8f-kw2vx Total loading time: 0 Render date: 2025-01-15T07:15:03.305Z Has data issue: false hasContentIssue false
  • English
  • Français

Organic Charge-Transfer Complexes for High Density Storage Using a Modified Scanning Tunneling Microscope

Published online by Cambridge University Press:  15 February 2011

Shoji Yamaguchi ,
Carlos A. Valenzuela  and
Richard S. Potember
Shoji Yamaguchi
Affiliation:
The Johns Hopkins University, Applied Physics Laboratory, Johns Hopkins Road, Laurel, Maryland 20723, U.S.A.
Carlos A. Valenzuela
Affiliation:
The Johns Hopkins University, Applied Physics Laboratory, Johns Hopkins Road, Laurel, Maryland 20723, U.S.A.
Richard S. Potember
Affiliation:
The Johns Hopkins University, Applied Physics Laboratory, Johns Hopkins Road, Laurel, Maryland 20723, U.S.A.
Get access

Abstract

We are investigating organometallic materials which exhibit a novel fieldinduced reversible switching phenomenon. Silver and copper salts of tetracyanoquinodimethane (TCNQ) and its derivatives, prepared as polycrystalline thick films and vacuum-deposited thin films, have been imaged using a scanning tunneling microscope (STM). We have recently produced images with molecular resolution of these materials. We also have demonstrated a field-induced, charge-transfer reaction driven by the electric field at the STM tip when the field generated by the STM exceeds the switching threshold of the organic charge-transfer complex. The phase transition induced by the STM tip appears as nanometer to micrometer-sized domains on the metal-TCNQ and derivatives surface. This STM-induced chemical reaction is being explored for use in a molecular-based information storage system.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 276: Symposia U/Y – Smart Materials Fabrication and Materials for Micro-Electro-Mechanical Systems , 1992 , 265
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Thomson, D. J., J. Microscopy (Oxford), 152, 627 (1988)Google Scholar
[2] Yamaguchi, S., Viands, C. A., and Potember, R. S., J. Vac. Sci. Technol.,B9, 1129 (1991)Google Scholar
[3] Matsumoto, M., Nishio, Y., Tachikbana, H., Nakanmura, T., Kawabata, Y., Samura, H. and Nagamura, T., Chem. Lett., 1021 (1991)Google Scholar
[4] Potember, R. S., Poehler, T. O., Rappa, A., Cowan, D. O. and Bloch, A. N., Syn. Metals, 4, 371 (1982)CrossRefGoogle Scholar
[5] Kamitsos, E. I., Tzinis, C. H., and Risen, W. M. Jr., Solid State Commun. 42, 561 (1982)Google Scholar