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Reliability Assurance for Thermo-Optic Solid State Optical Switches

Published online by Cambridge University Press:  10 February 2011

P. M. C. De Dobbelaere ,
P. J. Van Der Wel ,
B. Hendriksen ,
M. C. Flipse ,
J. Thackara ,
N. Zhu  and
J. Freeman
P. M. C. De Dobbelaere
Affiliation:
Akzo Nobel Electronic Products Inc., Sunnyvale, CA94089, peter.dd@akzo-nobel.com
P. J. Van Der Wel
Affiliation:
Akzo Nobel Photonics, PO Box 9300, 6800SB, Arnhem, The Netherlands, paul.van.der.wel@arnhem.akzonobel.nl
B. Hendriksen
Affiliation:
Akzo Nobel Photonics, PO Box 9300, 6800SB, Arnhem, The Netherlands, paul.van.der.wel@arnhem.akzonobel.nl
M. C. Flipse
Affiliation:
Akzo Nobel Photonics, PO Box 9300, 6800SB, Arnhem, The Netherlands, paul.van.der.wel@arnhem.akzonobel.nl
J. Thackara
Affiliation:
Akzo Nobel Electronic Products Inc., Sunnyvale, CA94089, peter.dd@akzo-nobel.com
N. Zhu
Affiliation:
Akzo Nobel Electronic Products Inc., Sunnyvale, CA94089, peter.dd@akzo-nobel.com
J. Freeman
Affiliation:
Akzo Nobel Electronic Products Inc., Sunnyvale, CA94089, peter.dd@akzo-nobel.com
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Abstract

The reliability assurance program for the BeamBoxTM thermo-optic solid state optical switches is presented. The different phases of the program are discussed, and some of the results are described.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 531: Symposium DD – Reliabilty of Photonics Materials & Structures , 1998 , 119
Copyright
Copyright © Materials Research Society 1998

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References

1. Tumolillo, T., et al., IEEE Communications Magazine (2), 124 (1997).Google Scholar
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3. EIA/TIA-455, MIL-STD-883D, MIL-STD-750, MIL-STD-202, Bellcore Technical Reference TR-NWT-000456Google Scholar