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Spontaneous Growth of Nickel Silicide Nanowires and Formation of Self-Assembled Nanobridges by the Metal Induced Growth Method

Published online by Cambridge University Press:  01 February 2011

Joondong Kim
Affiliation:
Department of Electrical Engineering, University at Buffalo, State University of New York, Buffalo, NY 14260, USA
Wayne A. Anderson
Affiliation:
Department of Electrical Engineering, University at Buffalo, State University of New York, Buffalo, NY 14260, USA
Young-Joo Song
Affiliation:
High-Speed SoC team, Electronics and Telecommunications Research Insititute, Yuseong-gu, Daejeon, 305-350, Korea
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Abstract

Nickel monosilicide (NiSi) nanowires (NWs) have been fabricated by the metal induced growth (MIG) method. Ni as a catalyst was deposited on a SiO2 coated Si wafer. In a DC magnetron sputtering system, the Ni reacts at 575°C with sputtered Si to give nanowires. Different metal catalysts (Co and Pd) were used to prove the MIG NW growth mechanism. NiSi NWs were a single crystal structure, 20-80 nm in diameter and 1-10 μm in length. The linear NW growth property provided nanobridge formation in a trenched Si wafer. The trenches in a Si wafer were made by dry etching and a simple, conventional metal lift off method. The self-assembled nanobridge can be applied to form nanocontacts at relatively low temperatures. The MIG NB is a promising 1 dimensional nanoscale building block to satisfy the need of ‘self and direct’ assembled ‘bottom-up’ fabrication concepts.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

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References

[1] Huang, Yu, Duan, Xiangfeng, Cui, Yi, and Lieber, Charles M., Nano Letters 2 (2002) 101 Google Scholar
[2] Alaca, B. Erdem, Sehitoglu, H., and Saif, Taher, Appl. Phys. Lett. 84 (2004), 4669.Google Scholar
[3] Ziegler, Kirk J., Lyons, D.M., and Holmes, Justin D., Erts, Donats, Polyakov, Boris, Olin, Hakan, Svensson, Krister, and Olsson, Eva, Appl. Phys. Lett. 84 (2004), 4047.Google Scholar
[4] Marrian, Christie R. K., and Tennant, D. M., J. Vac. Sci. Technol. A 21 (2003), S207.Google Scholar
[5] Thong, J. T. L, Oon, C.H., Yeadon, M., and Zhang, W.D., Appl. Phys. Lett. 81 (2002), 4823.Google Scholar
[6] Decker, C. A., Solanki, R., Freeouf, J. L., Carruthers, J. R., and Evans, D. R., Appl. Phys.Lett. 84 (2004), 1389.Google Scholar
[7] Yakushiji, K., Mitani, S., Takanashi, K., Takahashi, S., Maekawa, S., Imamura, H., and Fujimori, H., Appl. Phys. Lett. 78 (2001), 515.Google Scholar
[8] Islam, M Saif, Sharma, S, kamins, T I, and Williams, R Stanley. Nanotechnology. 15 (2004), L5.Google Scholar
[9] Nastaushev, Y. V., Cavrilova, T., Kachanova, M., Nenasheva, L., Kolosanov, V., Naumova, O.V., Popov, V.P., and , Assev, Mater. Sci. Eng. C 19 (2002), 189.Google Scholar
[10] Kim, Joondong, Anderson, Wayne A., Guliants, Elena A. and Bunker, Christopher E., Morphological Changes while Growing Nickel Monosilicide Nanowires, Boston U.S.A., Nov. 28 - Dec. 2, 2004, Materials Research Society Symposium Proceeding 854E (2004) U 5. 10.Google Scholar
[11] Kim, Joondong, and Anderson, Wayne A., Thin Solid Films, (In press).Google Scholar
[12] Bartur, M. and Nicolet, M-A., J. Appl. Phys. 54 (1983) 5404.Google Scholar
[13] Finstad, T.G., Mayer, J.W., and Nicolet, M-A., Thin Solid Films 51 (1978) 391 Google Scholar
[14] Kim, Joondong, Ji, Chunhai, and Anderson, Wayne A., Silicon Nanowire Growth at Relatively Low Processing Temperature, San Francisco, U.S.A., April 12-16, 2004, Materials Research Society Symposium Proceeding 818 (2004) M 11. 11.Google Scholar