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Strain in Epitaxial BaTiO3 Thin Films Prepared by MOCVD

Published online by Cambridge University Press:  10 February 2011

S. Chattopadhyay ,
A. Teren  and
B.W. Wessels
S. Chattopadhyay
Affiliation:
Materials Science Department, Northwestern University, 2225 N. Campus Drive, Evanston, IL 60208, USA
A. Teren
Affiliation:
Materials Science Department, Northwestern University, 2225 N. Campus Drive, Evanston, IL 60208, USA
B.W. Wessels
Affiliation:
Materials Science Department, Northwestern University, 2225 N. Campus Drive, Evanston, IL 60208, USA, b-wessels@nwu.edu
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Abstract

The microstrain in epitaxial BaTiO3 thin films has been investigated using x-ray diffraction. The full width half maximum of the (001) diffraction peaks ranged from 0.12 to 0.49 deg. From the analysis of the angular dependence of the diffraction peak broadening, it is concluded that the broadening is due predominantly to strain. The magnitude of the microstrain decreases sharply with increasing film thickness.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 541: Symposium O – Ferroelectric Thin Films VII , 1998 , 489
Copyright
Copyright © Materials Research Society 1999

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References

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