Hostname: page-component-78c5997874-94fs2 Total loading time: 0 Render date: 2024-11-13T02:57:57.160Z Has data issue: false hasContentIssue false
  • English
  • Français

Thin Film of Conjugated Schiff-Base as Ultrahigh Density Data Storage Material

Published online by Cambridge University Press:  10 February 2011

W. J. Yang ,
Q. C. Yang ,
H. G. Lu ,
H. Y. Chen ,
S. M. Hou ,
L. P. Ma ,
H. X. Zhang ,
Z. Q. Xue  and
S. J. Pang
W. J. Yang
Affiliation:
College of Chemistry, Peking Univ., Beijing 100871, P.R.China
Q. C. Yang
Affiliation:
College of Chemistry, Peking Univ., Beijing 100871, P.R.China
H. G. Lu
Affiliation:
College of Chemistry, Peking Univ., Beijing 100871, P.R.China
H. Y. Chen*
Affiliation:
College of Chemistry, Peking Univ., Beijing 100871, P.R.China
S. M. Hou
Affiliation:
Department of Electronics, Peking Univ.Beijing 100871, P.R.China
L. P. Ma
Affiliation:
Beijing Laboratory of Vacuum Physics, Chinese Academy of Science, Beijing 100080, P.R.China
H. X. Zhang
Affiliation:
Beijing Laboratory of Vacuum Physics, Chinese Academy of Science, Beijing 100080, P.R.China
Z. Q. Xue
Affiliation:
Department of Electronics, Peking Univ.Beijing 100871, P.R.China
S. J. Pang
Affiliation:
Beijing Laboratory of Vacuum Physics, Chinese Academy of Science, Beijing 100080, P.R.China
*
*To whom the correspondence should be addressed.
Get access

Abstract

N-(3-nitrobenzylidene)-p-phenylenediamine (NBPDA) was used as ultrahigh density data storage medium by scanning tunneling microscope (STM) technique. Data marks of 1.4nm in diameter were written by applying voltage pulses between the STM tip and the substrate. Structures of single crystal and thin films were characterized by IR, UV–Vis, XRD, STM and verified by DFT quantum chemical calculation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 488: Symposium J – Electrical, Optical & Magnetic Properties of Organic IV , 1997 , 891
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Salaneck, W.R., Lundstrom, I. and Ranly, B. ed. Conjugated Polymers and Related Materials—the Interconnection of Chemical and Electronic Structure, Proceedings, 81st Nobel Symposium, 13 (June 18, 1991, Lulca), (Oxford University Press, Oxford, 1993), pp. 502.Google Scholar
2. Lyons, M.H. ed., Materials for Non-Linear and Electro–optico, (IOP publishing Ltd., Bristol and N.Y., 1989).Google Scholar
3. Potember, R.S., Poehler, T.O., Hoffman, R.C., in Molecular Elctronic Devices II, (edited by Cartex, F.L., Marcel Dekker Inc. New York & Basel, 1988), pp. 97–110.Google Scholar
4. Xu, W., Chen, G.R. and Hua, Z.Y., Vac.Sci.Tech.(China), 15 (6), 363–367 (1995).Google Scholar
5. Xu, W., Chen, G.R., and Hua, Z.Y., Appl.Phys.Lett. 67(15), 2241–2242 (1995).10.1063/1.115116Google Scholar
6. Yano, K., Kuroda, R., Shimada, Y., Shido, S., Kyogaku, M., Matsuda, H., Takimoto, K., Eguchi, K. and Nakagiri, T., J.Vac.Sci.Technol. B 14(2),1353–1355 (1996).Google Scholar
7. Ma, L.P., Song, Y.L.. Gao, H.J., Zhao, W.B., Chen, H.Y., Xue, Z.Q., Pang, S.J., Appl.Phys. Lett. 69(24), 1–2 (1996).Google Scholar
8. Gao, H.J., Ma, L.P., Zhang, H.X., Chen, H.Y., Xue, Z.Q. and Pang, S.J., J.Vac.Sci.Technol. B 15(4), 1581–1583 (1997).Google Scholar
9. Hodgkin, J.H. and Heller, J., J.Polym.Sci.: Part C, 29, 37–46 (1970).Google Scholar
10. Fritchie, C.J., Acta.Cryst. 20, 892–898 (1966).Google Scholar
11. Chen, C. Julian, Introduction to scanning tunneling microscope, (Chinese Light Industry Press, 1996), pp. 189–205.Google Scholar