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Tin Oxide Based Transparent Ferromagnetic Semiconductor Thin Films by Spray Pyrolysis

Published online by Cambridge University Press:  01 February 2011

Subhash Chand Kashyap
Affiliation:
skashyap@physics.iitd.ac.in, Indian Institute of Technology, Department of physics, Deparment of Physics, IIT Delhi, Hauz Khas, New Delhi, India, New Delhi, DELHI, 110016, India, +91-11-26591346, +91-11-26581114
Kalon Gopinadhan
Affiliation:
gopinadhank@gmail.com, Indian Institute of Technology Delhi, Thin Film Laboratory, Department of Physics, Hauz Khas, New Delhi, 110016, India
Sujeet Chaudhary
Affiliation:
sujeetc@physics.iitd.ac.in, Indian Institute of Technology Delhi, Thin Film Laboratory, Department of Physics, Hauz Khas, New Delhi, 110016, India
Dinesh K. Pandya
Affiliation:
dkpandya@physics.iitd.ac.in, Indian Institute of Technology Delhi, Thin Film Laboratory, Department of Physics, Hauz Khas, New Delhi, 110016, India
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Abstract

Cobalt- and manganese-incorporated SnO2 thin films exhibiting room temperature ferromagnetism have been prepared by spray pyrolysis technique. Analysis of structural, magnetic and electrical properties of Sn1−xCoxO2−δ thin films indicates that the origin of ferromagnetism, seen for x<0.125, lies in the polarization of free carriers, leading to the necessary exchange interaction. The films exhibit a Curie temperature > 500K. The XRD study indicates that Sn1−xCoxO2−δ films with x<0.125 is single phasic with no evidence of any Co clusters or magnetic oxides, which supports the intrinsic nature of the ferromagnetism. The electrical transport studies indicate that extra electrons are generated on Co-incorporation in the SnO2 lattice. In the case of Sn1−xMnxO2·δ films, ferromagnetism is observed in a narrow range of manganese (0.075≤x≤0.10) with an associated increase in carrier concentration. The detailed analysis of various properties suggests that Mn-ions have been incorporated in the SnO2 lattice, and there is absence of any Mn-clusters, Mn-related secondary phases.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

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References

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