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Analysis of powder diffraction data collected with synchrotron X-ray and multiple 2D X-ray detectors applying a beta-distribution peak profile model

Published online by Cambridge University Press:  05 September 2017

Takashi Ida ,
Kento Wachi ,
Daiki Hattan ,
Shoki Ono ,
Shoji Tachiki ,
Yuki Nakanishi ,
Yasuhiro Sakuma ,
Akio Wada  and
Shin-ichi Towata
Takashi Ida*
Affiliation:
Advanced Ceramics Research Center, Nagoya Institute of Technology, Asahigaoka, Tajimi, Gifu 507-0071, Japan Aichi Synchrotron Radiation Center, Minamiyamaguchi-cho, Seto, Aichi 489-0965, Japan
Kento Wachi
Affiliation:
Advanced Ceramics Research Center, Nagoya Institute of Technology, Asahigaoka, Tajimi, Gifu 507-0071, Japan
Daiki Hattan
Affiliation:
Advanced Ceramics Research Center, Nagoya Institute of Technology, Asahigaoka, Tajimi, Gifu 507-0071, Japan
Shoki Ono
Affiliation:
Advanced Ceramics Research Center, Nagoya Institute of Technology, Asahigaoka, Tajimi, Gifu 507-0071, Japan
Shoji Tachiki
Affiliation:
Aichi Synchrotron Radiation Center, Minamiyamaguchi-cho, Seto, Aichi 489-0965, Japan
Yuki Nakanishi
Affiliation:
Aichi Synchrotron Radiation Center, Minamiyamaguchi-cho, Seto, Aichi 489-0965, Japan
Yasuhiro Sakuma
Affiliation:
Aichi Synchrotron Radiation Center, Minamiyamaguchi-cho, Seto, Aichi 489-0965, Japan
Akio Wada
Affiliation:
Aichi Synchrotron Radiation Center, Minamiyamaguchi-cho, Seto, Aichi 489-0965, Japan
Shin-ichi Towata
Affiliation:
Aichi Synchrotron Radiation Center, Minamiyamaguchi-cho, Seto, Aichi 489-0965, Japan
*
a)Author to whom correspondence should be addressed. Electronic mail: ida.takashi@nitech.ac.jp
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Abstract

A powder diffraction measurement system constructed on a beam-line BL5S2 at Aichi Synchrotron Radiation Center in Seto, Japan, has been modified for extensive use of two-dimensional (2D) X-ray detectors. Four flat 2D detectors are currently mounted on the movable stages on supporting rods radially attached to the 2Θ-wheel of the goniometer with the interval of 25°. The 2D powder diffraction intensity data are reduced to conventional 1D format of powder diffraction data by the method based on averaging of the pixel intensities with geometrical corrections, which also enables evaluation of standard uncertainties about the reduced intensity data. The 1D powder diffraction data of a 0.1 mm-capillary LaB6 (NIST SRM660b) sample obtained at the camera length of 340 mm have shown almost symmetric peak profile with slight asymmetry simulated by a beta-distribution profile function.

Keywords

synchrotron2D detector
Type
Technical Articles
Information
Powder Diffraction , Volume 32 , Supplement S1 , September 2017 , pp. S172 - S178
Copyright
Copyright © International Centre for Diffraction Data 2017 

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References

Caglioti, G., Paoletti, A., and Ricci, F. P. (1958). “Choice of collimators for a crystal spectrometer for neutron diffraction,” Nucl. Instrum. 3, 223–228.Google Scholar
Deutsch, M., Förster, E., Hölzer, G., Härtwig, J., Hämäläinen, K., Kao, C.-C., Huotar, S. and Diamant, R. (2004). “X-ray spectrometry of copper: new results on an old subject,” J. Res. Natl. Inst. Stand. Technol. 109, 75–98.Google Scholar
Ida, T. (2016). “Experimental estimation of uncertainties in powder diffraction intensities with a two-dimensional X-ray detector,” Powder Diffr. 31, 216–222.Google Scholar
Kraft, P., Bergamaschi, A., Brönnimann, Ch., Dinapoli, R., Eikenberry, E. F., Graafsma, H., Henrich, B., Johnson, I., Kobas, M., Mozzanica, A., Schlepüz, C. M., and Schmitt, B. (2009). “Characterization and calibration of PILATUS detectors”, IEEE Trans. Nucl. Sci. 56, 758–764.Google Scholar
Rietveld, H. M. (1969). “A profile refinement method for nuclear and magnetic structures,” J. Appl. Crystallogr. 2, 65–71.Google Scholar
Sulyanov, S. N., Popov, A. N., and Kheiker, D. M. (1994). “Using a two-dimensional detector for x-ray powder diffractometry,” J. Appl. Crystallogr. 27, 934–942.CrossRefGoogle Scholar