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D-114 Invited—Nanostructured Materials Characterization by X-ray Diffraction

Published online by Cambridge University Press:  20 May 2016

I. Dragomir ,
R. L. Snyder ,
M. Kirkham ,
R. Yang  and
Z. L. Wang
I. Dragomir
Affiliation:
Cernatescu, PANalytical Inc., Natick, MA
R. L. Snyder
Affiliation:
Georgia Institute of Technology, Atlanta, GA
M. Kirkham
Affiliation:
Georgia Institute of Technology, Atlanta, GA
R. Yang
Affiliation:
Georgia Institute of Technology, Atlanta, GA
Z. L. Wang
Affiliation:
Georgia Institute of Technology, Atlanta, GA
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 22 , Issue 2 , June 2007 , pp. 184
Copyright
Copyright © Cambridge University Press 2007

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