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D123 Strain Effects in Thin Film / SI Substrates Revealed by X-ray Microdiffraction

Published online by Cambridge University Press:  20 May 2016

C. E. Murray ,
I. C. Noyan ,
B. Lai  and
Z. Cai
C. E. Murray
Affiliation:
IBM, Yorktown Heights, NY
I. C. Noyan
Affiliation:
IBM, Yorktown Heights, NY
B. Lai
Affiliation:
Argonne National Laboratory, Argonne, IL
Z. Cai
Affiliation:
Argonne National Laboratory, Argonne, IL
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 18 , Issue 2 , June 2003 , pp. 176
Copyright
Copyright © Cambridge University Press 2003

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