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F-18 High Performance Silicon Drift Detectors with Integrated Fet for XRF Analysis

Published online by Cambridge University Press:  20 May 2016

A. Niculae ,
H. Soltau ,
P. Lechner ,
A. Liebl ,
G. Lutz ,
R. Eckhard ,
L. Strüder ,
G. Schaller  and
F. Schopper
A. Niculae
Affiliation:
PNSensor GmbH, Munich, Germany
H. Soltau
Affiliation:
PNSensor GmbH, Munich, Germany
P. Lechner
Affiliation:
PNSensor GmbH, Munich, Germany
A. Liebl
Affiliation:
PNSensor GmbH, Munich, Germany
G. Lutz
Affiliation:
PNSensor GmbH, Munich, Germany
R. Eckhard
Affiliation:
PNSensor GmbH, Munich, Germany
L. Strüder
Affiliation:
Semiconductor Laboratory of MPI, Munich, Germany
G. Schaller
Affiliation:
Semiconductor Laboratory of MPI, Munich, Germany
F. Schopper
Affiliation:
Semiconductor Laboratory of MPI, Munich, Germany
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 22 , Issue 2 , June 2007 , pp. 178
Copyright
Copyright © Cambridge University Press 2007

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